Electrothermal Analysis of Vlsi Systems - Rilegato

Cheng, Yi-Kan; Tsai, Ching-Han; Teng, Chin-Chi; Kang, Sung-Mo

 
9780792378617: Electrothermal Analysis of Vlsi Systems
Rilegato
ISBN 10: 079237861X ISBN 13: 9780792378617
Casa editrice: Kluwer Academic Pub, 2000

Sinossi

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Recensione

From the Foreword:

`Continuing increases in the levels of circuit integration and concomitant increases in performance are sustaining the trend of increasing power dissipation in VLSI systems. A consequence is that the impact of temperature on the successful operation and reliability of devices must be comprehended during the design process.....This text provides a comprehensive formulation of the electrothermal analysis problem beginning with a summary of the sources of power dissipation in CMOS circuits and followed by a formulation of the effect of temperature on MOS devices.'
Dr. Ralph K. Cavin, Vice President, Semiconductor Research Corporation

Contenuti

List of Figures. List of Tables. Preface. Acknowledgments. Part I: The Building Blocks. 1. Introduction. 2. Power Analysis for CMOS Circuits. 3. Temperature-Dependent MOS Device Modeling. 4. Thermal Simulation for VLSI Systems. 5. Fast-Timing Electrothermal Simulation. Part II: The Applications. 6. Temperature-Dependent Electromigration Reliability. 7. Temperature-Driven Cell Placement. 8. Temperature Driven Power and Timing Analysis. Index.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Kluwer Academic Pub
Data di pubblicazione
2000
Lingua
Inglese
ISBN 10 
079237861X
ISBN 13 
9780792378617
Rilegatura
Copertina rigida
Numero di pagine
210
Contatto del produttore
non disponibile
Persona responsabile
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Germania

Altre edizioni note dello stesso titolo

9781475773736: Electrothermal Analysis of VLSI Systems

Edizione in evidenza

ISBN 10:  1475773730 ISBN 13:  9781475773736
Casa editrice: Springer, 2013
Brossura