VLSI Test Principles and Architectures: Design for Testability - Brossura

Brossura

ISBN 10: 1493300865 ISBN 13: 9781493300860

Casa editrice: Morgan Kaufmann, 2014

Riassunto

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Su questo libro

Informazioni sull?autore

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Dettagli dell?edizione

• Editore: Morgan Kaufmann
• Data di pubblicazione: 2014
• ISBN 10: 1493300865
• ISBN 13: 9781493300860
• Rilegatura: Copertina flessibile
• Lingua: Inglese
• Numero di pagine: 812
• Redattore: Wang Laung-Terng
• Contatto del produttore: non disponibile