Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Rilegato

Reimer, Ludwig

Rilegato

ISBN 10: 3540853170 ISBN 13: 9783540853176

Casa editrice: Springer Nature, 2020

Riassunto

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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Contenuti

Introduction.- Electron optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.-

Dettagli dell'edizione

• Editore: Springer Nature
• Data di pubblicazione: 2020
• Lingua: Inglese
• ISBN 10: 3540853170
• ISBN 13: 9783540853176
• Rilegatura: Copertina rigida
• Numero edizione: 3
• Redattore: Reichelt Rudolf
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania