Techniques for Power and Reliability Optimization of CMOS Logic: Power optimization, soft error tolerance improvement - Brossura
Sinossi
As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.
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L'autore
Dr. Diril completed his Ph.D. in 2005 at Georgia Institute of Technology on the subject of low power design and reliability of CMOS circuits. After finishing his Ph.D., he worked at NVIDIA in the power optimization team. Then he joined Vivante Corporation as a design engineer. He is currently the Director of Hardware Engineering at Vivante.
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Techniques for Power and Reliability Optimization of CMOS Logic
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LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme. 108 pp. Englisch. Codice articolo 9783848409624
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Techniques for Power and Reliability Optimization of CMOS Logic
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
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Techniques for Power and Reliability Optimization of CMOS Logic
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Techniques for Power and Reliability Optimization of CMOS Logic
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LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Diril Abdulkadir UtkuDr. Diril completed his Ph.D. in 2005 at Georgia Institute of Technology on the subject of low power design and reliability of CMOS circuits. After finishing his Ph.D., he worked at NVIDIA in the power optimizati. Codice articolo 5520155
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Techniques for Power and Reliability Optimization of CMOS Logic
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Techniques for Power and Reliability Optimization of CMOS Logic
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LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 108 pp. Englisch. Codice articolo 9783848409624
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Techniques for Power and Reliability Optimization of CMOS Logic : Power optimization, soft error tolerance improvement
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LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme. Codice articolo 9783848409624
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Techniques for Power and Reliability Optimization of CMOS Logic | Power optimization, soft error tolerance improvement
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LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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Taschenbuch. Condizione: Neu. Techniques for Power and Reliability Optimization of CMOS Logic | Power optimization, soft error tolerance improvement | Abdulkadir Utku Diril | Taschenbuch | 108 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783848409624 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Codice articolo 106602299
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Techniques for Power and Reliability Optimization of CMOS Logic: Power optimization, soft error tolerance improvement
Editore:
LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623
ISBN 13: 9783848409624
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