Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. 108.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: preigu, Osnabrück, Germania
EUR 43,35
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Techniques for Power and Reliability Optimization of CMOS Logic | Power optimization, soft error tolerance improvement | Abdulkadir Utku Diril | Taschenbuch | 108 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783848409624 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 122,32
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Aggiungi al carrelloPaperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 49,00
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme. 108 pp. Englisch.
Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: Majestic Books, Hounslow, Regno Unito
EUR 79,98
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 108 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: moluna, Greven, Germania
EUR 41,05
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Diril Abdulkadir UtkuDr. Diril completed his Ph.D. in 2005 at Georgia Institute of Technology on the subject of low power design and reliability of CMOS circuits. After finishing his Ph.D., he worked at NVIDIA in the power optimizati.
Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 80,56
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Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 108.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 49,00
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 108 pp. Englisch.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3848409623 ISBN 13: 9783848409624
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 49,00
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.