VLSI Test Principles and Architectures: Design for Testability

Wang, Laung-Terng

ISBN 10: 1493300865 / ISBN 13: 9781493300860

Editore: Morgan Kaufmann Publishers, 2006

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Codice articolo ERICA82914933008656

Dati bibliografici

• Titolo: VLSI Test Principles and Architectures: Design for Testability
• Editore: Morgan Kaufmann Publishers
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 1493300865
• ISBN 13: 9781493300860
• Rilegatura: Paperback
• Condizione: New
• Tipo di libro: book

Descrizione articolo

Riassunto

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Informazioni sull?autore

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).