VLSI Test Principles and Architectures

Wang, Laung-Terng/ Wu, Cheng-Wen/ Wen, Xiaoqing

ISBN 10: 1493300865 / ISBN 13: 9781493300860

Editore: Morgan Kaufmann, 2006

Riguardo questo articolo

1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock. Codice articolo zk1493300865

Dati bibliografici

Titolo: VLSI Test Principles and Architectures

Casa editrice: Morgan Kaufmann

Data di pubblicazione: 2006

Legatura: Paperback

Condizione: Brand New

Descrizione articolo

Riassunto:

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Informazioni sull?autore:

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).