Testing of Digital Systems

Jha, Niraj, Gupta, Sandeep

ISBN 10: 0521773563 / ISBN 13: 9780521773560

Editore: Cambridge University Press, 2003

Riguardo questo articolo

Ships from the UK. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.

Codice articolo 16456042-6

Dati bibliografici

• Titolo: Testing of Digital Systems
• Editore: Cambridge University Press
• Data di pubblicazione: 2003
• Lingua: Inglese
• ISBN 10: 0521773563
• ISBN 13: 9780521773560
• Rilegatura: Rilegato
• Edizione: 1st Edition.
• Condizione: Very Good

Descrizione articolo

Riassunto

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

Informazioni sugli autori

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.