9780521773560 - testing of digital systems di jha, n. k.; gupta, s. (19 risultati)
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- Prima edizione
Da: Kellogg Creek Books, Portland, OR, U.S.A.Kellogg Creek Books
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 39,98
EUR 4,53 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Very Good. 1st Edition. Binding tight, content clean and straight. If purchasing internationally please inquire about shipping charges before purchase. Ships within 1-2 business days.Ships within 1-2 business days.
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- Prima edizione
Da: Better World Books: West, Reno, NV, U.S.A.Better World Books: West
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 51,79
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Good. 1st Edition. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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- Prima edizione
Da: Webbooks, Wigtown, Wigtown, , Regno UnitoWebbooks, Wigtown
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 33,38
EUR 34,72 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hard Cover. Condizione: Good. No Jacket. First Edition. From an academic library with the usual stamps etc. This item is heavy and will attract postal surcharges.
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Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 51,88
EUR 20,39 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560.
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Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 51,88
EUR 20,39 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560.
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Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 83,52
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.
- Rilegato
- Prima edizione
Da: brandnewtexts4sale, Houston, TX, U.S.A.brandnewtexts4sale
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 115,47
EUR 6,03 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: New. 1st Edition. 100% BRAND NEW US HARDCOVER STUDENT Edition / Mint condition / Never been read / ISBN-10: 0521773563 / Shipped out in one business day with free tracking.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 153,04
EUR 13,86 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 177,02
EUR 10,50 spedizioneSpedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. The most comprehensive and wide ranging book on the testing of semiconductor devices and systems. Num Pages: 1016 pages, 90 tables. BIC Classification: TJF. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 247 x 174 x 49. Weight in Grams: 2185. . 2003. hardcover. . . . .
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Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 215,32
EUR 9,06 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New. The most comprehensive and wide ranging book on the testing of semiconductor devices and systems. Num Pages: 1016 pages, 90 tables. BIC Classification: TJF. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 247 x 174 x 49. Weight in Grams: 2185. . 2003. hardcover. . . . .…Books ship from the US and Ireland.
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 222,92
EUR 28,93 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. Like New. book.
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 282,66
EUR 69,49 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know abo…ut this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
- Rilegato
Da: Revaluation Books, Exeter, , Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 341,53
EUR 23,15 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 1st edition. 1016 pages. 10.20x7.25x1.75 inches. In Stock.
- Rilegato
- Print on Demand
Da: Revaluation Books, Exeter, , Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 163,56
EUR 23,15 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Brand New. 1st edition. 1016 pages. 10.20x7.25x1.75 inches. In Stock. This item is printed on demand.
- Rilegato
- Prima edizione
- Print on Demand
Da: CitiRetail, Stevenage, Regno UnitoCitiRetail
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 162,70
EUR 42,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over USD40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject.…Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. A book on the testing of semiconductor devices and systems. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
- Rilegato
- Print on Demand
Da: Majestic Books, Hounslow, , Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 237,71
EUR 7,52 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Condizione: New. Print on Demand pp. xvi + 1000 Illus.
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- Prima edizione
- Print on Demand
Da: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 217,69
EUR 31,92 spedizioneSpedito da Australia a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over USD40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject.…Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. A book on the testing of semiconductor devices and systems. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
- Rilegato
- Prima edizione
- Print on Demand
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 263,70
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over USD40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject.…Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. A book on the testing of semiconductor devices and systems. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
- Rilegato
- Print on Demand
Da: moluna, Greven, , Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 226,60
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineer…s, it is both an excellent senior/graduate level te.
