hardcover. Condizione: Acceptable. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket.
Hardcover. Condizione: Fair. 1986. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
Hardcover. Condizione: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Condizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Hardcover. Condizione: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Hardcover. Condizione: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Hardcover. Condizione: Good. hardback book in good condition,upper corner near rear panel has slight moist air exposure.
Condizione: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.
Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
EUR 12,99
Quantità: 1 disponibili
Aggiungi al carrellogebundene Ausgabe. Condizione: Gut. 448 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Einbandkanten sind leicht bestoßen. Leichte altersbedingte Anbräunung des Papiers. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1005.
Condizione: Acceptable. SHIPS FAST. RESCUED + REPAIRED. Features a small coffee mishap, plus a reinforced binding, secured cover, and light annotations or highlighting-a durable, fully readable working copy brought back to life at a great value by our Book Sustainability Project. No access codes or CDs.
Hardcover. Condizione: Near Fine. Condizione sovraccoperta: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.
EUR 53,16
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Da: online-buch-de, Dozwil, Svizzera
EUR 64,00
Quantità: 1 disponibili
Aggiungi al carrelloJun 01, 1992. Condizione: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage.
Da: California Books, Miami, FL, U.S.A.
EUR 118,60
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 112,39
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
EUR 92,27
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Aggiungi al carrelloCondizione: New.
paperback. Condizione: New. In shrink wrap. Looks like an interesting title!
EUR 160,06
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Aggiungi al carrelloCondizione: New. In.
EUR 162,21
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Revaluation Books, Exeter, Regno Unito
EUR 165,21
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 2nd edition. 840 pages. 10.00x7.00x1.67 inches. In Stock.
EUR 141,20
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Principles of Analytical Electron Microscopy | Joseph Goldstein (u. a.) | Taschenbuch | xvi | Englisch | 2013 | Springer | EAN 9781489920393 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Cambridge University Press, 1991
ISBN 10: 1558991239 ISBN 13: 9781558991231
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 202,61
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer US, Springer New York Jul 2013, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 160,49
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 468 pp. Englisch.
Lingua: Inglese
Editore: Springer, Chapman And Hall/CRC, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 168,73
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
EUR 168,73
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
EUR 235,86
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 464 pages. 9.26x6.11x1.20 inches. In Stock.
EUR 227,63
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Very Good. Very Good. book.