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EUR 5,69
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Spedito da Francia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloSoftcover. Condizione: Très bon. Ancien livre de bibliothèque avec équipements. Edition 2013. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 2013. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: Sell Books, Elland, YORKS, Regno Unito
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Aggiungi al carrellohardcover. Condizione: Good. Our good condition books are generally good for reading but not for gifting or collecting. They could have imperfections such as creasing, fanning, inscriptions, margin notes, yellowing, staining on edge or cover or pages, bumps, scuffs, etc etc (sometimes multiple of these). It's a wide category that encompasses anything that isn't almost-new down to anything that is slightly better than poor. We would NOT recommend gifting Good books - these should be considered reading copies. Our books are dispatched from a Yorkshire former cotton mill. We list via barcode/ISBN so please note that the images are stock images and may not be the exact copy you receive, furthermore the details about edition and year might not be accurate as many publishers reuse the same ISBN for multiple editions and as we simply scan a barcode or enter an ISBN we do not check the validity of the edition data when listing. If you're looking for an exact edition please don't order (at least not without checking with us first, although we don't always have time to check). We aim to dispatch prompty, the service used will depend on order value and book size. We can ship to most countries, see our shipping policies. Payment is via Abe only.
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Cathodoluminescence Microscopy of Inorganic Solids
Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
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EUR 11,95
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Aggiungi al carrellogebundene Ausgabe. Condizione: Gut. 292 Seiten; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Sprache: Englisch Gewicht in Gramm: 620.
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Microanalysis of Solids
Lingua: Inglese
Editore: Plenum Press, New York and London, 1994
ISBN 10: 030644433X ISBN 13: 9780306444333
Da: Row By Row Bookshop, Sugar Grove, NC, U.S.A.
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Prima edizione
Hardcover. Condizione: Good. Condizione sovraccoperta: No Dust Jacket. First Edition. An ex-library copy in laminated pictorial hard covers, with the usual ex-libris markings. The binding is sound, the text is clean/unmarked, and there is little wear to the covers. No dust jacket, presumed as issued. Book.
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Microanalysis of Solids
Da: Phatpocket Limited, Waltham Abbey, HERTS, Regno Unito
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Aggiungi al carrelloCondizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Extended Defects In Semiconductors: Electronic Properties,Device Effects And Structures (Pb 2007)
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
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Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Extended Defects In Semiconductors: Electronic Properties,Device Effects And Structures (Pb 2007)
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107424143 ISBN 13: 9781107424142
Da: California Books, Miami, FL, U.S.A.
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EUR 103,42
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Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107424143 ISBN 13: 9781107424142
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 93,69
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Semiconductor Materials: An Introduction to Basic Principles (Microdevices)
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 115,70
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Adhesive Bonding In Photonics Assembly And Packaging
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
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Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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ADHESIVE BONDING IN PHOTONICS ASSEMBLY AND PACKAGING (HB 2003)
Da: Basi6 International, Irving, TX, U.S.A.
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Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Microanalysis of Solids - Cell to System
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
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Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Microanalysis of Solids - Cell to System
Da: Basi6 International, Irving, TX, U.S.A.
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Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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EUR 34,11
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Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Seiten: 484 | Sprache: Englisch | Produktart: Bücher | The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.
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Cathodoluminescence Microscopy of Inorganic Solids
Da: CSG Onlinebuch GMBH, Darmstadt, Germania
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EUR 59,42
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Aggiungi al carrelloGebundene Ausgabe. Condizione: Gut. Gebraucht - Gut ausgesondertes Bibliotheksexemplar mit den üblichen Signaturen, -Microcharacterization of materials is a rapidly advancing field. Among the many electron and ion probe techniques, the cathodoluminescence mode of an electron probe instrument has reached a certain maturity, which is reflected by an increas ing number of publications in this field. The rapid rate of progress in applications of cathodoluminescence techniques in characterizing inorganic solids has been especially noticeable in recent years. The main purpose of the book is to outline the applications of cath odoluminescence techniques in the assessment of optical and electronic proper ties of inorganic solids, such as semiconductors, phosphors, ceramics, and min erals. The assessment provides, for example, information on impurity levels derived from cathodoluminescence spectroscopy, analysis of dopant concentra tions at a level that, in some cases, is several orders of magnitude lower than that attainable by x-ray microanalysis, the mapping of defects, and the determination of carrier lifetimes and the charge carrier capture cross sections of impurities. In order to make the book self-contained, some basic concepts of solid-state phys ics, as well as various cathodoluminescence techniques and the processes leading to luminescence phenomena in inorganic solids, are also described. We hope that this book will be useful to both scientists and graduate students interested in microcharacterization of inorganic solids. This book, however, was not intended as a definitive account of cathodoluminescence analysis of in organic solids. In considering the results presented here, readers should re member that many materials have properties that vary widely as a function of preparation conditions.
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Semiconductor Materials
Da: Books Puddle, New York, NY, U.S.A.
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Condizione: New. pp. 240.
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Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: California Books, Miami, FL, U.S.A.
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EUR 178,71
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Semiconductor Materials: An Introduction to Basic Principles (Microdevices)
Da: Revaluation Books, Exeter, Regno Unito
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EUR 168,10
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Aggiungi al carrelloPaperback. Condizione: Brand New. 237 pages. 9.61x6.69x0.55 inches. In Stock.
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Cathodoluminescence Microscopy of Inorganic Solids
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 164,62
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EUR 104,15
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Semiconductor Materials | An Introduction to Basic Principles | B. G. Yacobi | Taschenbuch | ix | Englisch | 2013 | Springer US | EAN 9781475777932 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 182,07
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Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 168,29
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Cathodoluminescence Microscopy of Inorganic Solids
Da: A Squared Books (Don Dewhirst), South Lyon, MI, U.S.A.
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Hardcover. Condizione: Very Good. New York, 1990; blue cloth covered boards; minimal shelf wear; 8vo - over 7 3/4" to 9 3/4" tall; better than very good condition; interior clean and unmarked; 292 pages.
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Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures
Lingua: Inglese
Editore: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 168,28
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Microanalysis of Solids
Da: Books Puddle, New York, NY, U.S.A.
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Condizione: Used. pp. 480.
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EUR 136,16
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Aggiungi al carrelloKartoniert / Broschiert. Condizione: New.
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EUR 123,65
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The technological progress is closely related to the developments of various materials and tools made of those materials. Even the different ages have been defined in relation to the materials used. Some of the major attributes of the present-day age (i.e., the electronic materials' age) are such common tools as computers and fiber-optic telecommunication systems, in which semiconductor materials provide vital components for various mic- electronic and optoelectronic devices in applications such as computing, memory storage, and communication. The field of semiconductors encompasses a variety of disciplines. This book is not intended to provide a comprehensive description of a wide range of semiconductor properties or of a continually increasing number of the semiconductor device applications. Rather, the main purpose of this book is to provide an introductory perspective on the basic principles of semiconductor materials and their applications that are described in a relatively concise format in a single volume. Thus, this book should especially be suitable as an introductory text for a single course on semiconductor materials that may be taken by both undergraduate and graduate engineering students. This book should also be useful, as a concise reference on semiconductor materials, for researchers working in a wide variety of fields in physical and engineering sciences.
