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benoit nadeau dostie (44 risultati)
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books: West, Reno, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Fine. Used book that is in almost brand-new condition. May contain a remainder mark. Better World Books: Buy Books. Do Good.
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books, Mishawaka, IN, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: -OnTimeBooks-, Phoenix, AZ, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: very_good. Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships USPS Media Mail.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: SatelliteBooks, Burlington, VT, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books Ltd, Dunfermline, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 41,74
Spedizione EUR 5,78
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: BennettBooksLtd, Los Angeles, CA, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 156,03
Spedizione EUR 2,29
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: Used. pp. 260.
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Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 164,28
Spedizione EUR 7,51
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Used. pp. 260 Illus.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 170,15
Spedizione EUR 2,29
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 154,73
Spedizione EUR 17,34
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 158,80
Spedizione EUR 17,34
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 164,11
Spedizione EUR 13,85
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 164,11
Spedizione EUR 13,85
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 163,80
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Used. pp. 260.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: California Books, Miami, FL, U.S.A.
Valutazione del venditore 4 su 5 stelle
EUR 180,82
Spedizione gratuita
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 182,95
Spedizione EUR 2,29
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 177,38
Spedizione EUR 17,34
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 167,87
Spedizione EUR 28,90
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 260.
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EUR 140,00
Spedizione EUR 70,00
Spedito da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Design for AT-Speed Test, Diagnosis and Measurement | Benoit Nadeau-Dostie | Taschenbuch | xvii | Englisch | 2013 | Springer US | EAN 9781475782912 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Design for AT-speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: Kluwer Academic Publishers, 1999
ISBN 10: 0792386698 ISBN 13: 9780792386698
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Valutazione del venditore 5 su 5 stelle
EUR 202,92
Spedizione EUR 10,50
Spedito da Irlanda a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 254 x 178 x 15. Weight in Grams: 670. . 1999. Hardback. . . . .
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EUR 168,73
Spedizione EUR 63,47
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: Springer US, Springer New York, 2013
ISBN 10: 1475782918 ISBN 13: 9781475782912
EUR 168,73
Spedizione EUR 62,48
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
-
Design for AT-speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: Kluwer Academic Publishers, 1999
ISBN 10: 0792386698 ISBN 13: 9780792386698
Da: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 254 x 178 x 15. Weight in Grams: 670. . 1999. Hardback. . . . . Books ship from the US and Ireland.
