Nadeau dostie benoit (45 risultati)

Condizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

hardcover. Condizione: Like New. Most items will be dispatched the same or the next working day. An apparently unread copy in perfect condition. Dust cover is intact with no nicks or tears. Spine has no signs of creasing. Pages are clean and not marred by notes or folds of any kind.

Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condizione: Very Good. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Condizione: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Condizione: good. This book is in good condition, with minimal signs of wear and tear.

Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Hardcover. Condizione: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.

hardcover. Condizione: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.

hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: Used. pp. 260.

Condizione: Used. pp. 260 Illus.

Condizione: New.

Condizione: New.

Condizione: Used. pp. 260.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

Condizione: New. In English.

Condizione: New. In English.

Condizione: As New. Unread book in perfect condition.

Condizione: New. pp. 260.

Taschenbuch. Condizione: Neu. Design for AT-Speed Test, Diagnosis and Measurement | Benoit Nadeau-Dostie | Taschenbuch | xvii | Englisch | 2013 | Springer US | EAN 9781475782912 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: New. Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 254 x 178 x 15. Weight in Grams: 670. . 1999. Hardback. . . . .…

Condizione: New. Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 254 x 178 x 15. Weight in Grams: 670. . 1999. Hardback. . . . . Books ship from the US and Ireland.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.…