Eggersglüß stephan (37 risultati)

XVIII, 193 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.

Condizione: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. pp. 212.

Hardcover. Condizione: Brand New. 193 pages. 9.50x6.50x0.75 inches. In Stock.

Taschenbuch. Condizione: Neu. High Quality Test Pattern Generation and Boolean Satisfiability | Stephan Eggersglüß (u. a.) | Taschenbuch | xviii | Englisch | 2014 | Springer | EAN 9781489988478 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condizione: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed in the last 30 years. But due to the ever increasing design complexity, new techniques have to be developed that can cope with today's circuits. While classical approaches are based on backtracking on the circuit structure, several approaches based on "Boolean Satisfiability" (SAT) have been proposed since the early 80s. In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work. …

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.…

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.…

Paperback. Condizione: Like New. Like New. book.

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: New.

Paperback. Condizione: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Condizione: As New. Unread book in perfect condition.

Condizione: New. In German.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Paperback. Condizione: Brand New. 238 pages. German language. 9.45x6.69x0.55 inches. In Stock.

Paperback. Condizione: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing - and this aim must be achieved at low cost, since every chip has to be tested separately after production.; Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Condizione: new. Questo è un articolo print on demand.

Condizione: new. Questo è un articolo print on demand.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT)Describes a highly fault efficient SAT-based ATPG frameworkIncludes an industrial perspective on the state-of-the-art in the testing, along with SAT t.…

Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The first book giving a detailed overview on SAT-based ATPGAll techniques are validated on industrial designsA comprehensive introduction to Boolean Satisfiability1 Introduction. 2 Preliminaries. 2.1 Circuits. 2.2 Fault Models. 2.3 .…

Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The first book giving a detailed overview on SAT-based ATPGAll techniques are validated on industrial designsA comprehensive introduction to Boolean Satisfiability1 Introduction. 2 Preliminaries. 2.1 Circuits. 2.2 Fault Models. 2.3 .…