Gizopoulos dimitris (91 risultati)
Lingua: Inglese
Editore: New Age International Publisher 2009
Serie: Frontiers in Electronic Testing, Libro 34 di 40. Libro 34 di 40 - Frontiers in Electronic Testing
- Brossura
- Edizione Internazionale
Da: Romtrade Corp., STERLING HEIGHTS, U.S.A.Romtrade Corp.
Contatta il venditoreVenditore con 5 stelleEdizione InternazionaleCondizione: Nuovo
EUR 26,83
Spedizione gratuitaSpedito in U.S.A.Quantità: 5 disponibili
Condizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be prin…ted on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Lingua: Inglese
Editore: New Age International Publisher 2009
Serie: Frontiers in Electronic Testing, Libro 34 di 40. Libro 34 di 40 - Frontiers in Electronic Testing
- Brossura
Da: SMASS Sellers, IRVING, U.S.A.SMASS Sellers
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 28,60
Spedizione gratuitaSpedito in U.S.A.Quantità: 5 disponibili
Condizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
- Rilegato
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, GermaniaUniversitätsbuchhandlung Herta Hold GmbH
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 20,00
EUR 30,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
xxii, 281 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
- Rilegato
Da: Basi6 International, Irving, U.S.A.Basi6 International
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 68,93
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Lingua: Inglese
Editore: Springer 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Basi6 International, Irving, U.S.A.Basi6 International
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 104,91
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Lingua: Inglese
Editore: Springer 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Antiquariaat Ovidius, Bredevoort, Paesi BassiAntiquariaat Ovidius
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 96,00
EUR 22,00 spedizioneSpedito da Paesi Bassi a U.S.A.Quantità: 1 disponibili
Condizione: Gebraucht / Used. Fine state d582e.
Advanced Parallel Processing Technologies: 16th International Symposium, Appt 2025, Athens, Greece, July 13-16, 2025, Proceedings
Li, Chao (Editor)/ Qian, Xuehai (Editor)/ Gizopoulos, Dimitris (Editor)/ Grot, Boris (Editor)
- Brossura
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 114,39
EUR 14,42 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Paperback. Condizione: Brand New. 400 pages. 9.25x6.10x9.21 inches. In Stock.
Cross-Layer Reliability of Computing Systems
Natale, Giorgio Di (EDT); Bosio, Alberto (EDT); Canal, Ramon (EDT); Carlo, Stefano Di (EDT); Gizopoulos, Dimitris (EDT)
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: GreatBookPrices, Columbia, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 128,19
EUR 2,26 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Lingua: Inglese
Editore: Institution of Engineering and Technology, GB 2020
- Rilegato
Da: Rarewaves USA, OSWEGO, U.S.A.Rarewaves USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 130,53
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. Reliability has always been a major concern in designing computing systems. However, the increasing complexity of such systems has led to a situation where efforts for assuring reliability have become extremely costly, both for the design of solutions for the mitigation of possible faults, and for the…reliability assessment of such techniques. Cross-layer reliability is fast becoming the preferred solution. In a cross-layer resilient system, physical and circuit level techniques can mitigate low-level faults. Hardware redundancy can be used to manage errors at the hardware architecture layer. Eventually, software implemented error detection and correction mechanisms can manage those errors that escaped the lower layers of the stack. This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. The book begins by addressing design techniques to improve the resilience of computing systems, covering the logic layer, the architectural layer and the software layer. The second part of the book focuses on cross-layer resilience, including coverage of physical stress, reliability assessment approaches, fault injection at the ISA level, analytical modelling for cross-later resiliency, and stochastic methods. Cross-Layer Reliability of Computing Systems is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: California Books, Miami, U.S.A.California Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 131,61
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Cross-Layer Reliability of Computing Systems
Natale, Giorgio Di (EDT); Bosio, Alberto (EDT); Canal, Ramon (EDT); Carlo, Stefano Di (EDT); Gizopoulos, Dimitris (EDT)
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: GreatBookPrices, Columbia, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 131,60
EUR 2,26 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 71,85
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Advanced Parallel Processing Technologies | 16th International Symposium, APPT 2025, Athens, Greece, July 13-16, 2025, Proceedings | Chao Li (u. a.) | Taschenbuch | Lecture Notes in Computer Science | xvii | Englisch | 2025 | Springer | EAN 9789819510207 | Verantwortliche Person für die EU: Springer… Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
- Rilegato
Da: Books Puddle, New York, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 147,21
EUR 3,42 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
- Brossura
Da: Mispah books, Redhill, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 121,23
EUR 28,85 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Brossura
Da: Books Puddle, New York, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 148,59
EUR 3,42 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. pp. 281.
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 86,08
EUR 63,46 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 16th International Symposium on Advanced Parallel Processing Technologies, APPT 2025, held in Athens, Greece, during July 13 16, 2025.The 17 full papers and 10 short papers included in this boo…k were carefully reviewed and selected from 74 submissions. They were organized in topical sections as follows: Chip and Accelerators, Memory and Storage, Cloud and Networking, Design for LLM and ML/AI, Big Data and Graph Processing, and Secure and Dependable System.
Cross-Layer Reliability of Computing Systems
Natale, Giorgio Di (EDT); Bosio, Alberto (EDT); Canal, Ramon (EDT); Carlo, Stefano Di (EDT); Gizopoulos, Dimitris (EDT)
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 138,76
EUR 17,31 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
Cross-Layer Reliability of Computing Systems
Natale, Giorgio Di (EDT); Bosio, Alberto (EDT); Canal, Ramon (EDT); Carlo, Stefano Di (EDT); Gizopoulos, Dimitris (EDT)
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 140,09
EUR 17,31 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Lingua: Inglese
Editore: The Institution of Engineering and Technology 2020
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 151,66
EUR 13,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 95,15
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Dependable Multicore Architectures at Nanoscale | Marco Ottavi (u. a.) | Taschenbuch | xxii | Englisch | 2018 | Springer | EAN 9783319853918 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Springer US 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Buchpark, Trebbin, GermaniaBuchpark
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Ottimo
EUR 61,51
EUR 105,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 440 | Sprache: Englisch | Produktart: Bücher | Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive ela…boration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today¿s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments. Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects. "There is a definite need for documenting the advances in testing ¿ I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [¿] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [¿] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 62,64 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyz…es various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 63,39 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes vari…ous dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Lingua: Inglese
Editore: Springer 2011
Serie: Frontiers in Electronic Testing, Libro 34 di 40. Libro 34 di 40 - Frontiers in Electronic Testing
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 163,83
EUR 13,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
Lingua: Inglese
Editore: Springer 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 163,83
EUR 13,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
Lingua: Inglese
Editore: Institution of Engineering and Technology, GB 2020
- Rilegato
Da: Rarewaves.com USA, London, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 180,32
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. Reliability has always been a major concern in designing computing systems. However, the increasing complexity of such systems has led to a situation where efforts for assuring reliability have become extremely costly, both for the design of solutions for the mitigation of possible faults, and for the…reliability assessment of such techniques. Cross-layer reliability is fast becoming the preferred solution. In a cross-layer resilient system, physical and circuit level techniques can mitigate low-level faults. Hardware redundancy can be used to manage errors at the hardware architecture layer. Eventually, software implemented error detection and correction mechanisms can manage those errors that escaped the lower layers of the stack. This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. The book begins by addressing design techniques to improve the resilience of computing systems, covering the logic layer, the architectural layer and the software layer. The second part of the book focuses on cross-layer resilience, including coverage of physical stress, reliability assessment approaches, fault injection at the ISA level, analytical modelling for cross-later resiliency, and stochastic methods. Cross-Layer Reliability of Computing Systems is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.
Lingua: Inglese
Editore: Institution of Engineering and Technology, GB 2020
- Rilegato
Da: Rarewaves USA United, OSWEGO, U.S.A.Rarewaves USA United
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 140,08
EUR 42,88 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. Reliability has always been a major concern in designing computing systems. However, the increasing complexity of such systems has led to a situation where efforts for assuring reliability have become extremely costly, both for the design of solutions for the mitigation of possible faults, and for the…reliability assessment of such techniques. Cross-layer reliability is fast becoming the preferred solution. In a cross-layer resilient system, physical and circuit level techniques can mitigate low-level faults. Hardware redundancy can be used to manage errors at the hardware architecture layer. Eventually, software implemented error detection and correction mechanisms can manage those errors that escaped the lower layers of the stack. This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. The book begins by addressing design techniques to improve the resilience of computing systems, covering the logic layer, the architectural layer and the software layer. The second part of the book focuses on cross-layer resilience, including coverage of physical stress, reliability assessment approaches, fault injection at the ISA level, analytical modelling for cross-later resiliency, and stochastic methods. Cross-Layer Reliability of Computing Systems is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 174,64
EUR 14,42 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 300 pages. 9.25x6.25x0.75 inches. In Stock.
- Brossura
Da: Mispah books, Redhill, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 164,01
EUR 28,85 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer 2004
Serie: Frontiers in Electronic Testing, Libro 34 di 40. Libro 34 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Books Puddle, New York, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 194,53
EUR 3,42 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Condizione: New. pp. 236.
