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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Application to Rough and Natural Surfaces.
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
Membro dell'associazione: GIAQ ILAB VDA
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EUR 18,00
Spedizione EUR 30,00
Spedito da Germania a U.S.A.Quantità: 3 disponibili
Aggiungi al carrello239 Fig., 7 Tabl., XII, 292 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. NanoScience and Technology. Sprache: Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 164,62
Spedizione EUR 13,89
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
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EUR 180,70
Spedizione EUR 5,82
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 179,16
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: As New. Unread book in perfect condition.
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ATOMIC FORCE MICROSCOPY, SCANNING NEARFI
Da: Speedyhen, Hertfordshire, Regno Unito
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EUR 161,53
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 207,02
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Da: Rarewaves.com USA, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 241,96
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Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. 1st ed. Softcover of orig. ed. 2006.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 225,76
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EUR 184,85
Spedizione EUR 70,00
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching | Application to Rough and Natural Surfaces | Gerd Kaupp | Taschenbuch | xii | Englisch | 2010 | Springer | EAN 9783642066634 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
EUR 205,81
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 308.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 308.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Lingua: Inglese
Editore: Springer, Springer Berlin Heidelberg, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
EUR 213,99
Spedizione EUR 62,35
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
EUR 227,74
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Lingua: Inglese
Editore: Springer, Berlin, Springer Berlin Heidelberg, Springer, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
EUR 223,11
Spedizione EUR 63,03
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Da: Rarewaves.com UK, London, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 228,68
Spedizione EUR 75,36
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. 1st ed. Softcover of orig. ed. 2006. Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (Nanoscience and Technology)
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 306,14
Spedizione EUR 11,59
Spedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 318,86
Spedizione EUR 28,99
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (eng)
Da: Brook Bookstore On Demand, Napoli, NA, Italia
Valutazione del venditore 5 su 5 stelle
EUR 166,29
Spedizione EUR 5,50
Spedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer, Berlin, Springer Berlin Heidelberg, Springer, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 213,99
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 292 pp. Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 213,99
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 308 pp. Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (Nanoscience and Technology)
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 236,25
Spedizione EUR 11,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock. This item is printed on demand.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Lingua: Inglese
Editore: Springer, Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
EUR 213,99
Spedizione EUR 60,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 308 pp. Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 299,28
Spedizione EUR 7,54
Spedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 308 239 Illus.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 299,89
Spedizione EUR 7,54
Spedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 308 Illus.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 297,06
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 308.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 297,43
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 308.
