michael nicolaidis (48 risultati)

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: Like New. Page block firm and clean, binding tight, boards straight. No markings of any kind. Fine, like new condition. Well packaged and promptly shipped from California. US veteran operated.

Condizione: New. In.

Condizione: New. In.

Condizione: New.

Condizione: New. pp. 164.

Condizione: New. pp. 168.

Hardcover. Condizione: New. BRAND NEW hardcover. Book.

Condizione: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .

Condizione: New.

Paperback. Condizione: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.

Condizione: New. In.

Condizione: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Condizione: New.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Condizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Paperback. Condizione: Like New. Like New. book.

Condizione: As New. Unread book in perfect condition.

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: As New. Unread book in perfect condition.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Hardcover. Condizione: Brand New. 316 pages. 9.25x6.25x1.00 inches. In Stock.

Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condizione: Brand New. 336 pages. 9.25x6.10x0.76 inches. In Stock.

64 pp.; 31 x 24 cm.; glue bound; black-and-white & color; edition size unknown; unsigned and unnumbered; offset-printed; This issue of Studio International contains a 48-page "exhibition" organized by Seth Siegelaub: "The content of the 48-page exhibition in this issue was organized by requesting six critics to each edit an 8-page section of the magazine, and in turn, to make available their section to the artist(s) that interest them. The Table of Contents lists the name of the artist(s) under the name of the critic who was responsible for their participation." -- Seth Siegelaub. Section curated by David Antin: Dan Graham, Harold Cohen, John Baldessari, Richard Serra, Eleanor Antin, Fred Lonidier, George Nicolaidis, Keith Sonnier; curated by Germano Celant: Giovanni Anselmo, Alighiero Boetti, Pier Paolo Calzolari, Mario Merz, Giuseppe Penono, Emilio Prini, Pistoletto, Gilberto Zorio; curated by Michel Claura: Daniel Buren; curated by Charles Harrison: Keith Arnatt, Terry Atkinson, David Bainbridge, Michael Baldwin, Harold Hurrell, Victor Burgin, Barry Flanagan, Joseph Kosuth, John Latham, Reolof Louw; curated by Lucy R. Lippard: Robert Barry, Stephen Kaltenbach, Lawrence Weiner, On Kawara, Sol LeWitt, Douglas Huebler, N.E. Thing Co., Frederick Barthelme curated by Hans Strelow: Jan Dibbets, and Hanne Darboven. References : "Sol LeWitt : Artist's Books" by Sol LeWitt, Giorgio Maffei, Emanuele De Donno, Didi Bozzini, Cecilia Metelli, Marilena Bonomo. Sant'Eraclio di Foligno, Italy : Edizioni Viaindustrie, 2009, pp. 38. No. 8.2 in "Artists' Magazines : An Alternative Space for Art" by Gwen Allen. Cambridge / London, MA / United Kingdom : The MIT Press, 2011, pp. 204. "Seth Siegelaub : Beyond Conceptual Art" by Leontine Coelewij, Sara Martinetti, Marja Bloem, Julia Bryan-Wilson, Jo Melvin, Götz Langkau, Matilda McQuaid, Alan Kennedy. Köln and Amsterdam, Germany / Netherlands : Verlag der Buchandlung Walther König / Stedelijk Museum, 2016, pp. 208 - 211. Fair / Good. 1.5 cm. tear to bottom of spine and 2 cm. tear to top edge of spine. 2.7 cm. dog-ear to top right corner of recto. 28.2 cm. blue pencil or ink mark on verso. Rubbing of cover edges. Bumping of top right corner of covers and pages. Names of 6 artists on contents page circled in black ink, pages yellowed, contents otehrwise clean and unmarked.