Posadas agham (16 risultati)
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 76,01
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 88,74
EUR 3,50 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Used. pp. 290.
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 89,51
EUR 7,55 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Used. pp. 290 146 Illus. (113 Col.).
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 89,42
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Condizione: Used. pp. 290.
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 115,85
EUR 13,91 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
Lingua: Inglese
Editore: Springer, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 130,34
EUR 29,02 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer Verlag, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 158,45
EUR 14,51 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 278 pages. 9.75x6.50x0.75 inches. In Stock.
Lingua: Inglese
Editore: Springer New York, Springer New York, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 111,53
EUR 63,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic devices and describes…possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, Integration of Functional Oxides with Semiconductors describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, ferroelectric and piezoelectric materials and the coupling between them will also be discussed. GaN, SiC, Si, GaAs and Ge semiconductors are covered within the context of optimizing next-generation device performance for monolithic device processing.
Lingua: Inglese
Editore: Springer New York, Springer, 2016
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 114,36
EUR 62,47 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic devices and des…cribes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, Integration of Functional Oxides with Semiconductors describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, ferroelectric and piezoelectric materials and the coupling between them will also be discussed. GaN, SiC, Si, GaAs and Ge semiconductors are covered within the context of optimizing next-generation device performance for monolithic device processing.
Lingua: Inglese
Editore: Springer, 2016
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Brossura
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 181,76
EUR 29,02 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Handbook of Molecular Beam Epitaxy of Oxide Materials (In 3 Volumes)
Ahn, Charles; Chambers, Scott; Demkov, Alexander A; Ekerdt, John; Jalan, Bharat; Kornblum, Lior; Ngai, Joseph; Posadas, Agham; Walker, Fred
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 1245,44
EUR 13,91 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 16 disponibili
Condizione: New. In.
Handbook of Molecular Beam Epitaxy of Oxide Materials (in 3 Volumes)
Ahn, Charles; Chambers, Scott; Demkov, Alexander A; Ekerdt, John; Jalan, Bharat; Kornblum, Lior; Ngai, Joseph; Posadas, Agham; Walker, Fred
Lingua: Inglese
Editore: World Scientific Publishing Company Dez 2025, 2025
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 1292,59
EUR 65,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Neuware - This set of books provide a detailed introduction to molecular beam epitaxy (MBE) of Oxides and modern characterization techniques used to analyze thin oxide films. A reprint volume containing seminal papers in the field allows the reader to experience the excitement of discovery first hand in th…e voices of people who made those discoveries. MBE revolutionized the semiconductor technology, but its introduction to oxide growth has been delayed, owing to a complex set of reasons that range from practical difficulties (chemically aggressive environment and high temperature) to fundamental differences from semiconductors (reactive growth). It aims to be a useful reference to an expert as well as a guide to a graduate student.
Lingua: Inglese
Editore: Springer New York Feb 2014, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic device…s and describes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, Integration of Functional Oxides with Semiconductors describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, ferroelectric and piezoelectric materials and the coupling between them will also be discussed. GaN, SiC, Si, GaAs and Ge semiconductors are covered within the context of optimizing next-generation device performance for monolithic device processing. 288 pp. Englisch.
Lingua: Inglese
Editore: Springer New York Sep 2016, 2016
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Brossura
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic… devices and describes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, Integration of Functional Oxides with Semiconductors describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, ferroelectric and piezoelectric materials and the coupling between them will also be discussed. GaN, SiC, Si, GaAs and Ge semiconductors are covered within the context of optimizing next-generation device performance for monolithic device processing. 288 pp. Englisch.
Lingua: Inglese
Editore: Springer New York, 2016
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Brossura
- Print on Demand
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 92,27
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Discusses why semiconductor substrates are an excellent integration platform for making hybrid logic/sensor devices Provides a brief introduction to the methods accessible to non-experts, before going into details in…teresting to the experts.
Lingua: Inglese
Editore: Springer New York, 2014
Serie: SpringerBriefs in Materials, Libro 13 di 68. Libro 13 di 68 - SpringerBriefs in Materials
- Rilegato
- Print on Demand
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 92,27
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Discusses why semiconductor substrates are an excellent integration platform for making hybrid logic/sensor devices Provides a brief introduction to the methods accessible to non-experts, before going into…details interesting to the experts.
