Schwizer jürg (14 risultati)

Lingua: Inglese
Editore: Springer 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Lingua: Inglese
Editore: Springer 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
Da: California Books, Miami, FL, U.S.A.California Books
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Condizione: New.

Lingua: Inglese
Editore: Springer 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 114,98
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Condizione: New. In.

Lingua: Inglese
Editore: Springer 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 139,28
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Condizione: New. In.
Altre immaginiLingua: Inglese
Editore: Springer 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Force Sensors for Microelectronic Packaging Applications | Jürg Schwizer (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9783642060632 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter:…preigu.

Lingua: Inglese
Editore: Springer Berlin Heidelberg 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 61,48 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-ti…me examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.

Lingua: Inglese
Editore: Springer, Berlin, Springer 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 112,77
EUR 61,99 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time exam…ination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.

Lingua: Inglese
Editore: Springer 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 183,95
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Lingua: Inglese
Editore: Springer 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 86,24
EUR 5,50 spedizioneSpedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Condizione: new. Questo è un articolo print on demand.

Lingua: Inglese
Editore: Springer Berlin Heidelberg Okt 2010 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in…situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging. 188 pp. Englisch.

Lingua: Inglese
Editore: Springer, Berlin, Springer Berlin Heidelberg, Springer 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ an…d real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging. 178 pp. Englisch.

Lingua: Inglese
Editore: Springer Berlin Heidelberg 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
- Print on Demand
Da: moluna, Greven, , Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 92,27
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Useful technique for packaging process control and analysisIntended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practi…cal monograph introduces no.

Lingua: Inglese
Editore: Springer Berlin Heidelberg 2004
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Rilegato
- Print on Demand
Da: moluna, Greven, , Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 93,00
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Useful technique for packaging process control and analysisIntended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practi…cal monograph introduces no.

Lingua: Inglese
Editore: Springer, Springer Spektrum Okt 2010 2010
Serie: Microtechnology and MEMS, Libro 2 di 17. Libro 2 di 17 - Microtechnology and MEMS
- Brossura
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ… and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 188 pp. Englisch.