Srikrishnan kris v (18 risultati)

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  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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    Da: Basi6 International, Irving, TX, U.S.A.Basi6 International

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    Condizione: Brand New. New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition.Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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    Hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.

  • Lingua: Inglese

    Editore: CRC Press, 2006

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  • Lingua: Inglese

    Editore: CRC Press, 2006

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  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2006

    1574446746 / 9781574446746

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    EUR 365,24

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    Condizione: New. pp. 536 2nd Edition.

  • Lingua: Inglese

    Editore: CRC Press, 2006

    1574446746 / 9781574446746

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    EUR 313,20

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    Condizione: New. Geraldine C. Schwartz, Geraldine Cogin Shwartz, Kris V. SrikrishnanFirst introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated .

  • Lingua: Inglese

    Editore: Taylor & Francis Inc, Bosa Roca, 2006

    1574446746 / 9781574446746

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    Hardcover. Condizione: new. Hardcover. First introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated treatment of interconnect technologies and its forward-looking perspective. The field has grown tremendously in the interim and many of the "likely directions" outlined in the first edition are now standard in modern facilities. Reflecting those advances, this edition delves into the practical aspects of interconnections for manufacturing. It examines the interconnect and fabrication technologies now available, with an examination of future prospects for the field.What's in this Edition: Detailed discussion of electrochemical equipment for plating copper Information on tools used for evaporation, chemical vapor deposition, and plasma processes Emphasis on measurement of mechanical and thermal properties of insulators Methods for characterizing porous dielectric thin films Greater focus on integration issues and properties of titanium, cobalt, and nickel silicides Process schemes based on the increased need for borderless contact gates and source/drain Expanded discussion on choices for low-dielectric insulators Concentration on electroplated copper, especially morphology of plated films and their properties Developments in thin film liners and barriers Expanded material on copper reliability Describes the equipment used in manufacturing for deposition and etching, such as electrochemical deposition equipment used for plating copper. This book emphasizes the measurement of mechanical and thermal properties as well as the use of EELS, energy filtering TEM, and atomic force microscopy. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

  • Lingua: Inglese

    Editore: Saint Lucie Pr, 2006

    1574446746 / 9781574446746

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    EUR 376,63

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    Hardcover. Condizione: Brand New. 2nd edition. 520 pages. 10.00x6.75x1.00 inches. In Stock.

  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2006

    1574446746 / 9781574446746

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    EUR 386,22

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    Quantità: 3 disponibili

    Condizione: New. pp. 536.

  • Lingua: Inglese

    Editore: Taylor & Francis Inc, 2006

    1574446746 / 9781574446746

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    Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    Condizione: New. Describes the equipment used in manufacturing for deposition and etching, such as electrochemical deposition equipment used for plating copper. This book emphasizes the measurement of mechanical and thermal properties as well as the use of EELS, energy filtering TEM, and atomic force microscopy. Editor(s): Schwartz, Geraldine Cogin; Srikrishnan, Kris V. Num Pages: 536 pages, 227 black & white illustrations, 12 black & white tables, 1 black & white halftones. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 30. Weight in Grams: 1133. . 2006. 2 Rev ed. Hardback. . . . .…

  • Lingua: Inglese

    Editore: CRC Press Feb 2006, 2006

    1574446746 / 9781574446746

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    Buch. Condizione: Neu. Neuware - First introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated treatment of interconnect technologies and its forward-looking perspective. The field has grown tremendously in the interim and many of the 'likely directions' outlined in the first edition are now standard in modern facilities. Reflecting those advances, this edition delves into the practical aspects of interconnections for manufacturing. It examines the interconnect and fabrication technologies now available, with an examination of future prospects for the field.What's in this Edition:- Detailed discussion of electrochemical equipment for plating copper - Information on tools used for evaporation, chemical vapor deposition, and plasma processes - Emphasis on measurement of mechanical and thermal properties of insulators - Methods for characterizing porous dielectric thin films - Greater focus on integration issues and properties of titanium, cobalt, and nickel silicides - Process schemes based on the increased need for borderless contact gates and source/drain - Expanded discussion on choices for low-dielectric insulators - Concentration on electroplated copper, especially morphology of plated films and their properties - Developments in thin film liners and barriers - Expanded material on copper reliability.…

  • Lingua: Inglese

    Editore: Saint Lucie Pr, 2006

    1574446746 / 9781574446746

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Hardcover. Condizione: Brand New. 2nd edition. 520 pages. 10.00x6.75x1.00 inches. In Stock.

  • Lingua: Inglese

    Editore: Taylor & Francis Inc, 2006

    1574446746 / 9781574446746

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    Condizione: New. Describes the equipment used in manufacturing for deposition and etching, such as electrochemical deposition equipment used for plating copper. This book emphasizes the measurement of mechanical and thermal properties as well as the use of EELS, energy filtering TEM, and atomic force microscopy. Editor(s): Schwartz, Geraldine Cogin; Srikrishnan, Kris V. Num Pages: 536 pages, 227 black & white illustrations, 12 black & white tables, 1 black & white halftones. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 30. Weight in Grams: 1133. . 2006. 2 Rev ed. Hardback. . . . . Books ship from the US and Ireland.…

  • Lingua: Inglese

    Editore: Taylor & Francis Inc, Bosa Roca, 2006

    1574446746 / 9781574446746

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    EUR 596,36

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    Hardcover. Condizione: new. Hardcover. First introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated treatment of interconnect technologies and its forward-looking perspective. The field has grown tremendously in the interim and many of the "likely directions" outlined in the first edition are now standard in modern facilities. Reflecting those advances, this edition delves into the practical aspects of interconnections for manufacturing. It examines the interconnect and fabrication technologies now available, with an examination of future prospects for the field.What's in this Edition: Detailed discussion of electrochemical equipment for plating copper Information on tools used for evaporation, chemical vapor deposition, and plasma processes Emphasis on measurement of mechanical and thermal properties of insulators Methods for characterizing porous dielectric thin films Greater focus on integration issues and properties of titanium, cobalt, and nickel silicides Process schemes based on the increased need for borderless contact gates and source/drain Expanded discussion on choices for low-dielectric insulators Concentration on electroplated copper, especially morphology of plated films and their properties Developments in thin film liners and barriers Expanded material on copper reliability Describes the equipment used in manufacturing for deposition and etching, such as electrochemical deposition equipment used for plating copper. This book emphasizes the measurement of mechanical and thermal properties as well as the use of EELS, energy filtering TEM, and atomic force microscopy. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2006

    1574446746 / 9781574446746

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    EUR 344,71

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    Condizione: New. pp. 536 Illus. This item is printed on demand.