Ubar raimund (41 risultati)
Editore: VEB Verlag Technik, Berlin, 1989, 1989
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Da: Versandantiquariat Kerzemichel, Wittenberge, GermaniaVersandantiquariat Kerzemichel
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215 S., 8°, Obrosch, 1. Auflg., mit 96 Bildern und 17 Tafeln, ehemaliges Bibliotheksexemplar, Stempel au Vs., Vorwort von den Herausgebern, sehr gut.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 115,02
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Paperback. Condizione: Brand New. 180 pages. 8.66x5.91x0.41 inches. In Stock.
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Da: StainesBook, Weybridge, SURRE, Regno UnitoStainesBook
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EUR 115,25
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Condizione: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 182,80
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Condizione: New. In.
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Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
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EUR 222,10
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Hardcover. Condizione: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two ty…pes of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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- Edizione Internazionale
Da: UK BOOKS STORE, London, LONDO, Regno UnitoUK BOOKS STORE
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EUR 246,94
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Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if t…he Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 240,21
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Hardcover. Condizione: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 257,77
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Condizione: New.
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 202,85
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Taschenbuch. Condizione: Neu. Structural Decision Diagrams in Digital Test | Theory and Applications | Raimund Ubar (u. a.) | Taschenbuch | Computer Science Foundations and Applied Logic | xiii | Englisch | 2025 | Springer | EAN 9783031447365 | Verantwortliche Person für die EU: Springer Basel AG in Springer Science + Business M…edia, Heidelberger Platz 3, 14197 Berlin, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 280,05
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Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer Nature Switzerland, Springer Nature Switzerland, 2025
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 235,39
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book int…roduces and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 235,39
EUR 65,93 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces… and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 318,64
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Condizione: New.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 318,97
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Condizione: New. 1st ed. 2024 edition NO-PA16APR2015-KAP.
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Da: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
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EUR 334,33
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Hardcover. Condizione: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two ty…pes of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 348,21
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Hardcover. Condizione: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 434,81
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Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 64,90
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for…modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. 180 pp. Englisch.
Software-Based Self-Test with Decision Diagrams for Microprocessors
Raimund Ubar|Artjom Jasnetski, Anton Tsertov|Adeboye Stephen Oyeniran
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Da: moluna, Greven, Germaniamoluna
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EUR 52,90
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Ubar RaimundRaimund Ubar, PhD: professor at Tallinn University of Technology, Estonia. Fields of Study: computer science, design for testability, fault diagnosis in digital systems. Lectured in 20+ uni…versities, participated in 10+ E.
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Software-Based Self-Test with Decision Diagrams for Microprocessors | Raimund Ubar (u. a.) | Taschenbuch | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786137339473 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de…| Anbieter: preigu Print on Demand.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 64,90
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for mode…ling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 180 pp. Englisch.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 65,68
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for model…ing of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 180 pp. Englisch.
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 72,70
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Taschenbuch. Condizione: Neu. Software-Based Self-Test for Microprocessors Using Decision Diagrams | Second Edition | Raimund Ubar (u. a.) | Taschenbuch | Englisch | 2025 | LAP LAMBERT Academic Publishing | EAN 9786200525383 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail…[at]preigu[dot]de | Anbieter: preigu Print on Demand.
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Da: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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EUR 197,45
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HRD. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
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HRD. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
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Da: moluna, Greven, Germaniamoluna
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EUR 189,24
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor…System-on Chip (MPSoC) or Network on Chip (NoC). Th.
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EUR 197,62
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proposes a new type of structural decision diagrams Valid for a vast array of applications in the field of digital testCovers speed-up of fault simulation, as well as test generation avoiding mutual masking of multip…le faultsP.
Lingua: Inglese
Editore: Springer Nature Switzerland, Springer Nature Switzerland Feb 2025, 2025
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 235,39
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of resea…rch.The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. 612 pp. Englisch.
