Vemula sudheer (5 risultati)
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 29,18 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Programmable Input/Output (I/O) cells are an integral part of any Field Programmable Gate Array (FPGA). The resources associated with the programmable I/O cells are increasing as newer architectures of FPGAs are being developed and… this increases the importance of testing them. A general Built-In Self-Test (BIST) architecture to test the programmable I/O cells in FPGAs or associated with the FPGA core of System-on-Chip (SoC) implementations is proposed. The I/O cells are tested for various modes of operation along with their associated programmable routing resources. The proposed BIST architecture has been implemented and verified on Atmel AT94K10 and AT94K40 SoCs. A total of 161 and 303 configuration downloads are required to test the I/O cells of AT94K10 and AT94K40 devices, respectively. The use of an embedded processor for dynamic partial reconfiguration reduced the number of configuration downloads to three for both the AT94K10 and AT94K40 devices. The implementation of dynamic partial reconfiguration gave a speed up of 99.39 times in test time and a reduction in configuration memory storage requirements by 101 times for AT94K40 devices. 100 pp. Englisch.
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Da: moluna, Greven, Germaniamoluna
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EUR 41,05
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Vemula SudheerMasters in VLSI Testing at Auburn University, Auburn, AL. Worked at Altera Corp. & NVIDIA Corp. as a Test Development engineer and Design For Test Engineer respectively.Programmable Input…/Output (I/O) cells are an .
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
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EUR 60,84 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Programmable Input/Output (I/O) cells are an integral part of any Field Programmable Gate Array (FPGA). The resources associated with the programmable I/O cells are increasing as newer architectures of FPGAs are being developed and this… increases the importance of testing them. A general Built-In Self-Test (BIST) architecture to test the programmable I/O cells in FPGAs or associated with the FPGA core of System-on-Chip (SoC) implementations is proposed. The I/O cells are tested for various modes of operation along with their associated programmable routing resources. The proposed BIST architecture has been implemented and verified on Atmel AT94K10 and AT94K40 SoCs. A total of 161 and 303 configuration downloads are required to test the I/O cells of AT94K10 and AT94K40 devices, respectively. The use of an embedded processor for dynamic partial reconfiguration reduced the number of configuration downloads to three for both the AT94K10 and AT94K40 devices. The implementation of dynamic partial reconfiguration gave a speed up of 99.39 times in test time and a reduction in configuration memory storage requirements by 101 times for AT94K40 devices.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 49,00
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Programmable Input/Output (I/O) cells are an integral part of any Field Programmable Gate Array (FPGA). The resources associated with the programmable I/O cells are increasing as newer architectures of FPGAs are being developed and thi…s increases the importance of testing them. A general Built-In Self-Test (BIST) architecture to test the programmable I/O cells in FPGAs or associated with the FPGA core of System-on-Chip (SoC) implementations is proposed. The I/O cells are tested for various modes of operation along with their associated programmable routing resources. The proposed BIST architecture has been implemented and verified on Atmel AT94K10 and AT94K40 SoCs. A total of 161 and 303 configuration downloads are required to test the I/O cells of AT94K10 and AT94K40 devices, respectively. The use of an embedded processor for dynamic partial reconfiguration reduced the number of configuration downloads to three for both the AT94K10 and AT94K40 devices. The implementation of dynamic partial reconfiguration gave a speed up of 99.39 times in test time and a reduction in configuration memory storage requirements by 101 times for AT94K40 devices.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 100 pp. Englisch.
