9780412145612 - failure analysis of integrated circuits: tools and techniques: 494 (14 risultati)
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
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Condizione: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 276.
Lingua: Inglese
Editore: Chapman and Hall, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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Condizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Edit…or(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . .
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
Da: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermaniaBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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Condizione: gut. 1999. Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494) In englischer Sprache. pages.
Lingua: Inglese
Editore: Springer, Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 168,73
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrat…ed circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Lingua: Inglese
Editore: Chapman and Hall, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Condizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Edit…or(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . . Books ship from the US and Ireland.
Lingua: Inglese
Editore: Springer US Jan 1999, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause…of electrical failures in integrated circuits. 276 pp. Englisch.
Lingua: Inglese
Editore: Springer US, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
- Print on Demand
Da: moluna, Greven, Germaniamoluna
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EUR 136,16
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understan…ding the root cause of electrical fa.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
- Print on Demand
Da: preigu, Osnabrück, Germaniapreigu
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Buch. Condizione: Neu. Failure Analysis of Integrated Circuits | Tools and Techniques | Lawrence C. Wagner | Buch | The Springer International Series in Engineering and Computer Science | xiii | Englisch | 1999 | Springer | EAN 9780412145612 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heid…elberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Lingua: Inglese
Editore: Springer, Springer Jan 1999, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 160,49
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Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures… in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 276 pp. Englisch.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 219,75
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Condizione: New. Print on Demand pp. 276 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Lingua: Inglese
Editore: Springer, 1999
Serie: Libro 195 di 260 - The Springer International Series in Engineering and Computer Science
- Rilegato
- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 226,53
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Condizione: New. PRINT ON DEMAND pp. 276.
