Isbn: 9780521158596 - focused ion beam systems: basics and applications (18 risultati)

Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9780521158596.

Condizione: New.

Condizione: New.

Condizione: New. In English.

Condizione: New.

Condizione: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, black & white illustrations. BIC Classification: TBN; TGM; TJFD5. Category: (P) Professional & Vocational. Dimension: 246 x 169 x 24. Weight in Grams: 668. . 2011. Reissue. paperback. . . . .…

Condizione: New. pp. 408.

Condizione: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, black & white illustrations. BIC Classification: TBN; TGM; TJFD5. Category: (P) Professional & Vocational. Dimension: 246 x 169 x 24. Weight in Grams: 668. . 2011. Reissue. paperback. . . . . Books ship from the US and Ireland.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.…

Condizione: As New. Unread book in perfect condition.

Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: As New. Unread book in perfect condition.

Paperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Condizione: New. Print on Demand pp. 408 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

Paperback. Condizione: new. Paperback. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condizione: New. PRINT ON DEMAND pp. 408.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuab. …

Taschenbuch. Condizione: Neu. Focused Ion Beam Systems | Basics and Applications | Nan Yao | Taschenbuch | Englisch | 2010 | Cambridge University Press | EAN 9780521158596 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…