9781441999757 - high quality test pattern generation and boolean satisfiability di eggersgluß, stephan; drechsler, rolf (13 risultati)
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Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, GermaniaUniversitätsbuchhandlung Herta Hold GmbH
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EUR 17,00
EUR 30,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
XVIII, 193 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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Da: StainesBook, Weybridge, SURRE, Regno UnitoStainesBook
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EUR 82,41
EUR 35,06 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 116,63
EUR 14,00 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 142,98
EUR 3,42 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. pp. 212.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 152,35
EUR 11,69 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 193 pages. 9.50x6.50x0.75 inches. In Stock.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 111,53
EUR 62,44 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which…is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 182,98
EUR 29,22 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 86,24
EUR 5,50 spedizioneSpedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Condizione: new. Questo è un articolo print on demand.
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is…presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other. 212 pp. Englisch.
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Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 89,99
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT)Describes a highly fault efficient SAT-based ATPG frameworkIncludes an industrial perspective on the state-of-the-art in the te…sting, along with SAT t.
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 147,40
EUR 7,60 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Condizione: New. Print on Demand pp. 212 55 Illus.
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 152,25
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: New. PRINT ON DEMAND pp. 212.
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is pres…ented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT);Describes a highly fault efficient SAT-based ATPG framework;Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.
