9781461375968 - reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development di way kuo, .; wei-ting kary chien; taeho kim (10 risultati)
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Reliability, Yield, and Stress Burn-In | A Unified Approach for Microelectronics Systems Manufacturing & Software Development | Way Kuo (u. a.) | Taschenbuch | Englisch | 2014 | Springer Nature B.V. | EAN 9781461375968 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 6912…1 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 424.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and mainten…ance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: - the economic impact of employing the microelectronics fabricated by in dustry, - a study of the relationship between reliability and yield, - the progression toward miniaturization and higher reliability, and - the correctness and complexity of new system designs, which include a very significant portion of software.
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Da: moluna, Greven, Germaniamoluna
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EUR 180,97
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Kartoniert / Broschiert. Condizione: New.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 236,48
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Paperback. Condizione: Brand New. 420 pages. 9.30x6.20x1.00 inches. In Stock.
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Condizione: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient opera…tion and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: - the economic impact of employing the microelectronics fabricated by in dustry, - a study of the relationship between reliability and yield, - the progression toward miniaturization and higher reliability, and - the correctness and complexity of new system designs, which include a very significant portion of software. 424 pp. Englisch.
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. Print on Demand pp. 424 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 228,03
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Condizione: New. PRINT ON DEMAND pp. 424.
