Isbn: 9781482210200 - spatial point patterns: methodology and applications with r (16 risultati)

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  • Lingua: Inglese

    Editore: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Lingua: Inglese

    Editore: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Lingua: Inglese

    Editore: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Lingua: Inglese

    Editore: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Condizione: New. pp. 400.

  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    EUR 197,96

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Taylor and Francis Inc, US, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    EUR 240,60

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    Hardback. Condizione: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

  • Lingua: Inglese

    Editore: Chapman & Hall, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Hardcover. Condizione: Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.

  • Lingua: Inglese

    Editore: Taylor and Francis Inc, US, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Hardback. Condizione: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

  • Lingua: Inglese

    Editore: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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  • Lingua: Inglese

    Editore: Chapman And Hall/CRC Nov 2015, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch.…

  • Lingua: Inglese

    Editore: CRC Press, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    HRD. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

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    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Lingua: Inglese

    Editore: Chapman And Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 di 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…