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Defect and Fault Tolerance in VLSI Systems Volume 2.
Da: Rivermead Books, Southampton., Regno Unito
Valutazione del venditore 1 su 5 stelle
Prima edizione
EUR 7,00
EUR 23,79 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHard Cover. Condizione: Very Good. No Jacket. First Edition. VG, hardback, maroon glazed board covers with white titles on spine turning purple, contents are clean and unmarked,large octavo 316pp. Ex-Admiralty Underwater Weapons Library. weight 750g. Ex-Library.
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Defect and Fault Tolerance in VLSI Systems 1992 IEEE International Workshop Proceedings
Editore: IEEE Computer Society Press, Los Alamos, NM, 1993
ISBN 10: 0818628359 ISBN 13: 9780818628351
Lingua: Inglese
Prima edizione
Hardcover. Condizione: New. No Jacket. 1st Edition. Black lettering on yellow covers. 8vo, 334pp.
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The IEEE international workshop on Defect & Fault-Tolerance in VLSI Systems, Proceedings, 1995.
Editore: IEEE Computer Society Press, Los Alamitos, 1995
ISBN 10: 0818671076 ISBN 13: 9780818671074
Lingua: Inglese
Da: Lost and Found Books, Healesville, VIC, Australia
Valutazione del venditore 5 su 5 stelle
EUR 37,08
EUR 6,89 per la spedizione da Australia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellohard cover. No Jacket. Illustrated in black and white. 305 pages VG. Slight shelf wear to covers, overall very good condition.
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Hardcover. Condizione: Acceptable. Some wear. Satisfaction 100% guaranteed.
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1998 International Symposium on Defect and Fault Tolerance in VLSI Systems, Proceedings.
Editore: Institute of Electrical & Electronics Engineers, New York
ISBN 10: 0818688327 ISBN 13: 9780818688324
Lingua: Inglese
Da: Alien Bindings, BALTIMORE, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Prima edizione
Softcover. Condizione: Very Good. No Jacket. First Edition. Ex research library book. The rear cover is lightly scuffed. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge.
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paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Defect and Fault Tolerance in VLSI Systems: Volume 1
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 103,67
EUR 3,44 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Defect and Fault Tolerance in VLSI Systems: Volume 1
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 109,84
EUR 13,57 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Defect and Fault Tolerance in VLSI Systems: Volume 1
Da: Chiron Media, Wallingford, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 110,89
EUR 17,55 per la spedizione da Regno Unito a U.S.A.Quantità: 10 disponibili
Aggiungi al carrelloPF. Condizione: New.
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EUR 116,58
EUR 22,55 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloSoft cover. Condizione: As New. I.E.E.E.Press/ Computer Society 2000 paperback 422 pages full of statistics, minor shelfwear but this is A BRAND NEW BOOK UNUSED. Full refund if not satisfied. 24 hour despatch via Insured for. If not pictured in this listing, a scan of the actual book is available on request.
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Defect and Fault Tolerance in VLSI Systems
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 380.
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Defect and Fault Tolerance in VLSI Systems: Volume 2
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 158,31
EUR 3,44 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Defect and Fault Tolerance in VLSI Systems: Volume 2 (Defect & Fault Tolerance in VLSI Systems)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 158,71
EUR 3,44 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Defect and Fault Tolerance in VLSI Systems: Volume 1
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 154,65
EUR 14,16 per la spedizione da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 374 pages. 9.45x6.61x0.86 inches. In Stock.
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Defect and Fault Tolerance in VLSI Systems: Volume 2
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 156,52
EUR 13,57 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Defect and Fault Tolerance in VLSI Systems: Volume 2 (Defect & Fault Tolerance in VLSI Systems)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 156,52
EUR 13,57 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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EUR 114,36
EUR 63,57 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
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Defect and Fault Tolerance in VLSI Systems
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 336.
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Defect and Fault Tolerance in VLSI Systems
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 332.
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EUR 141,30
EUR 70,00 per la spedizione da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Defect and Fault Tolerance in VLSI Systems | Volume 2 | C. H. Stapper (u. a.) | Taschenbuch | xiii | Englisch | 2013 | Humana | EAN 9781475799590 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France. Proceedings
Editore: Institute of Electrical & Electronics Engineers, New York
ISBN 10: 0818681683 ISBN 13: 9780818681684
Lingua: Inglese
Da: Alien Bindings, BALTIMORE, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Prima edizione
Softcover. Condizione: Very Good. No Jacket. First Edition. Ex research library book. The covers look great. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge.
-
EUR 166,62
EUR 63,34 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
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Defect and Fault Tolerance in VLSI Systems : Volume 2
Editore: Springer US, Springer New York, 2013
ISBN 10: 1475799594 ISBN 13: 9781475799590
Lingua: Inglese
EUR 168,73
EUR 63,13 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
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Defect and Fault Tolerance in VLSI Systems: Volume 2
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 233,93
EUR 14,16 per la spedizione da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 329 pages. 10.00x7.01x0.75 inches. In Stock.
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Defect and Fault Tolerance in VLSI Systems: Volume 2
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 222,88
EUR 28,32 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
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The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 288,23
EUR 28,32 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Defect and Fault Tolerance in VLSI Systems
Editore: Springer, Springer Jun 2012, 2012
ISBN 10: 1461568013 ISBN 13: 9781461568018
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 106,99
EUR 23,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized. 380 pp. Englisch.
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EUR 92,27
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of .
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Defect and Fault Tolerance in VLSI Systems: Volume 1
Editore: Springer-Verlag New York Inc., 2012
ISBN 10: 1461568013 ISBN 13: 9781461568018
Lingua: Inglese
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 134,89
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Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 751.
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Defect and Fault Tolerance in VLSI Systems
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 152,05
EUR 7,36 per la spedizione da Regno Unito a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 380 66:B&W 7 x 10 in or 254 x 178 mm Perfect Bound on White w/Gloss Lam.
