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Aggiungi al carrelloPaperback. Condizione: New.
Condizione: New. 1st edition NO-PA16APR2015-KAP.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 101,69
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Aggiungi al carrelloPaperback. Condizione: Brand New. 770 pages. 10.00x7.00x1.75 inches. In Stock.
EUR 227,57
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Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
EUR 227,56
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EUR 248,98
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Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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EUR 239,03
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Aggiungi al carrelloCondizione: New. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
Condizione: New. pp. 770.
EUR 283,28
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Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 792 pages. 10.00x7.10x1.50 inches. In Stock.
EUR 302,63
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Aggiungi al carrelloCondizione: New. pp. 770.
Lingua: Inglese
Editore: Taylor & Francis Inc Nov 2008, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 296,71
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 76,42
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Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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EUR 114,14
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Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 103,23
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Aggiungi al carrelloPAP. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Da: moluna, Greven, Germania
EUR 76,47
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 132,30
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
Da: Majestic Books, Hounslow, Regno Unito
EUR 262,62
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pp. 770 This item is printed on demand.