Defects silicon (182 risultati)

Pamphlet. Condizione: Very Good. Vol 38, No 4, pp. 1554-1560, Illus, 4to, Extracted from orig vol, begins with Title page, trimmed & stapled, thus is like a pamphlet, VG.

Pamphlet. Condizione: Very Good. Vol 38, No 1, pp. 81-95, Illus, Extracted from orig vol, then Recased in Orig Journal Covers, VG.

Soft cover. Condizione: Very Good. ORIGINAL 1975 PUBLICATION; Softcover; paper clip stain on cover page; o/w in very good condition. Book.

Pamphlet. Condizione: Very Good. Vol 39, No 9, pp. 4391-4398, Illus, 4to, Extracted from orig vol, thus begins with title page, stapled & trimmed pamphlet, else VG.

Condizione: New.

Paperback or Softback. Condizione: New. Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide. Book.

Condizione: As New. Unread book in perfect condition.

Pamphlet. Condizione: Very Good. Vol 39, No 11, pp. 4999-5009, Illus, 4to,Extracted from orig vol, begins with title page, stapled & trimmed, thus is like a pamphlet, VG.

Pamphlet. Condizione: Very Good. Vol 39, No 6, pp. 2890-2904, Illus, Extracted from orig vol, then Recased in Orig Journal Covers, thus is like a pamphlet, else VG.

Condizione: New. In English.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: Very Good. Nice clean bright tight book 215 pages.

Condizione: New.

Paperback or Softback. Condizione: New. Defects in Boron Ion Implanted Silicon. Book.

Condizione: New.

Condizione: New.

Paperback. Condizione: New.

Taschenbuch. Condizione: Neu. Neuware - A three-dimensional Positron Annihilation Spectroscopy System (3DPASS) capable to simultaneously measure three-dimensional electron-positron (e--e+) momentum densities measuring photons derived from e--e+ annihilation events was designed and characterized. 3DPASS simultaneously collects a single data set of correlated energies and positions for two coincident annihilation photons using solid-state double-sided strip detectors (DSSD). Positions of photons were determined using an interpolation method which measures a figure-of-merit proportional to the areas of transient charges induced on both charge collection strips directly adjacent to the charge collection strips interacting with the annihilation photons. The subpixel resolution was measured for both double-sided strip detectors (DSSD) and quantified using a new method modeled after a Gaussian point-spread function with a circular aperture.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant. …

Condizione: New. In English.

Paperback. Condizione: Brand New. 80 pages. 8.66x5.98x0.71 inches. In Stock.

Condizione: New.

Condizione: New. In English.

Condizione: New. In English.

PF. Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Paperback. Condizione: New.

Condizione: New.

Condizione: New.