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failure analysis integrated circuits (28 risultati)
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Mahler Books, PFLUGERVILLE, TX, U.S.A.
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Hardcover. Condizione: Very Good. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages.
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: World of Books (was SecondSale), Montgomery, IL, U.S.A.
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Condizione: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: The Book Bin, Salem, OR, U.S.A.
Membro dell'associazione: ABAA CBA ILAB
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Hardcover. Condizione: As New. Binding firm, interior clean and unmarked. A nice copy.
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: BennettBooksLtd, Los Angeles, CA, U.S.A.
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hardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceEUR 86,93
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Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: Gut. 268 Seiten; 9780412145612.3 Gewicht in Gramm: 1.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 156,02
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Spedito in U.S.A.Quantità: Più di 20 disponibili
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Lucky's Textbooks, Dallas, TX, U.S.A.
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EUR 154,86
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Lucky's Textbooks, Dallas, TX, U.S.A.
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EUR 155,25
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 159,06
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 159,06
Spedizione EUR 13,78
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: California Books, Miami, FL, U.S.A.
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EUR 175,23
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: California Books, Miami, FL, U.S.A.
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EUR 175,23
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 159,05
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
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EUR 201,86
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Spedito da Irlanda a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . .
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceLingua: Inglese
Editore: Springer US, Springer New York Jan 1999, 1999
ISBN 10: 0412145618 ISBN 13: 9780412145612
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 60,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 276 pp. Englisch.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceEUR 165,03
Spedizione EUR 62,09
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceLingua: Inglese
Editore: Springer US, Springer New York, 1999
ISBN 10: 0412145618 ISBN 13: 9780412145612
EUR 168,73
Spedizione EUR 62,91
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 236,87
Spedizione EUR 17,25
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . . Books ship from the US and Ireland.
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 227,40
Spedizione EUR 28,75
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 260,86
Spedizione EUR 2,22
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 277,15
Spedizione EUR 28,75
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch.
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceEUR 136,16
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
-
Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceEUR 136,16
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
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Failure Analysis of Integrated Circuits | Tools and Techniques
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceEUR 141,20
Spedizione EUR 70,00
Spedito da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Failure Analysis of Integrated Circuits | Tools and Techniques | Lawrence C. Wagner | Buch | xiii | Englisch | 1999 | Springer | EAN 9780412145612 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Failure Analysis of Integrated Circuits
Libro 195 di 260: The Springer International Series in Engineering and Computer ScienceLingua: Inglese
Editore: Springer, Springer Nov 2012, 2012
ISBN 10: 1461372313 ISBN 13: 9781461372318
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 60,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
