Da: Mahler Books, PFLUGERVILLE, TX, U.S.A.
EUR 13,11
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Very Good. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages.
Da: SecondSale, Montgomery, IL, U.S.A.
EUR 53,98
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
Da: SecondSale, Montgomery, IL, U.S.A.
EUR 53,98
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloCondizione: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.
EUR 52,61
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: As New. Binding firm, interior clean and unmarked. A nice copy.
Editore: Kluwer Academic Publishers, 1999
ISBN 10: 0412145618 ISBN 13: 9780412145612
Lingua: Inglese
Da: New Book Sale, London, Regno Unito
EUR 41,33
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. Usually Dispatched within 1-2 Business Days , Buy with confidence , excellent customer service.
Da: BennettBooksLtd, San Diego, NV, U.S.A.
EUR 128,48
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
Da: Toscana Books, AUSTIN, TX, U.S.A.
EUR 151,54
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 153,61
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Best Price, Torrance, CA, U.S.A.
EUR 148,06
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloCondizione: New. SUPER FAST SHIPPING.
Da: Best Price, Torrance, CA, U.S.A.
EUR 148,06
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloCondizione: New. SUPER FAST SHIPPING.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 156,54
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 156,94
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 158,37
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 158,36
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 178,29
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 179,53
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Editore: Springer US, Springer New York Jan 1999, 1999
ISBN 10: 0412145618 ISBN 13: 9780412145612
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 160,49
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 276 pp. Englisch.
Editore: Springer US, Springer New York Nov 2012, 2012
ISBN 10: 1461372313 ISBN 13: 9781461372318
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 160,49
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
EUR 162,91
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Editore: Springer US, Springer New York, 1999
ISBN 10: 0412145618 ISBN 13: 9780412145612
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 168,73
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 276,29
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Good. Good. book.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 160,49
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 160,49
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch.
Da: moluna, Greven, Germania
EUR 136,16
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
Da: moluna, Greven, Germania
EUR 136,16
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.