D keith bowen (26 risultati)

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

gebundene Ausgabe. Condizione: Gut. 589 Seiten Das hier angebotene Buch stammt aus einer teilaufgelösten Bibliothek und kann die entsprechenden Kennzeichnungen aufweisen (Rückenschild, Instituts-Stempel.); der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Original-Schutzumschlag vorhanden (siehe Foto). In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1125. …

Condizione: As New. Unread book in perfect condition.

Paperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: New. In.

Condizione: New.

Condizione: New.

Condizione: New. pp. 296 Index.

Condizione: New. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size. Num Pages: 296 pages, 152 black & white illustrations, 14 black & white tables, 50 black & white halftones. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 245 x 162 x 21. Weight in Grams: 586. . 2006. 1st Edition. hardcover. . . . .…

Hardback. Condizione: New. The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems.Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text.Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.…

Condizione: New. pp. 296.

Condizione: New. D. Keith Bowen, Brian K. TannerThe scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved us.

Hardcover. Condizione: Brand New. 1st edition. 296 pages. 9.50x6.25x0.75 inches. In Stock.

Condizione: As New. Unread book in perfect condition.

Condizione: New. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size. Num Pages: 296 pages, 152 black & white illustrations, 14 black & white tables, 50 black & white halftones. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 245 x 162 x 21. Weight in Grams: 586. . 2006. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.…

Buch. Condizione: Neu. X-Ray Metrology in Semiconductor Manufacturing | D. Keith Bowen (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 2006 | CRC Press | EAN 9780849339288 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. …

Condizione: As New. Unread book in perfect condition.

Hardback. Condizione: New. The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems.Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text.Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.…

Encuadernación de tapa blanda. Condizione: Bien. Condizione sovraccoperta: Bien. Essays "Q & A: Jeffrey Slonim on Pet Piles," by Jeffery Slonim; "Letter from Paris: Pascaline Cuvelier [and] Olivier Zahm on A.P.C," by Pascaline Cuvelier and Olivier Zahm; "Preview: Florine Stettheimer at the Whitney: Jutta Koether talks with Elisabeth Sussman," by Jutta Koether; "Preview: Florine Stettheimer at the Whitney: Brooks Adams on the Florine Scene," by Brooks Adams; "Film: Brian D'Amato on Robert Longo's Johnny Mnemonic," by Brian D'Amato; "Gadget Love: R. U. Sirius reviews J. C. Herz's Surfing the Internet," by Gadget Love; "Music: Christina Kelly on Jenny Toomey," by Christina Kelly; "Real Life Rock: Greil Marcus' Top Ten," by Greil Marcus; "Goth to Dance: Donald Kuspit talks with Georg Baselitz," by Donald Kuspit; "Critical Reflections: Dale Hickey with an introduction by Peter Schjeldahl," by Dale Hickey and Peter Schieldahl; "Venezia / Venezuela: A Project for Artforum by Meyer Vaisman with an introduction by Jesús Fuenmayor," by Meyer Vaisman and Jesús Fuenmayor; "Diary of a Sad Housewife: Collier Schorr talks with Todd Haynes," by Collier Schorr; "Art of Living: James Meyer talks with Gregg Bordowitz," by James Meyer; "Into the Blue: Yves Klein: Comic Relief," by Nan Rosenthal; "Into the Blue: Yves Klein: Klein and Poses," by Benjamin H. D. Buchloh; "Openings: Maurizio Cattelan," by Olivier Zahm. Book reviews by John Ash, Yve-Alain Bois, Jean-Pierre Criqui, Arthur C. Danto, Jeffery Deitch, Bruce Hainley, bell hooks, Wayne Koestenbaum, Rhonda Lieberman, Richard Martin, Patrick McGrath, D. A. Miller, Michael Musto, Peter Schjeldahl, Richard Shiff, Richard Stone, Justin Spring, Carol Squiers, and Mim Udovitch. Reviews by Jan Avgikos, Peter Bowen, Barry Schwabsky, Andrew Solomon, Joshua Decter, Donald Kuspit, David Rimanelli, Keith Seward, Ingrid Schaffner, Faye Hirsch, Dan Cameron, John Ash, Ronny Cohen, Steven Drukman, Nico Israel, Joan Seeman Robinson, Laurie Palmer, Rosetta Brooks, Benjamin Weissman, Thomas McEvilley, John K. Grande, José Luis Brea, Menene Gras Balaguer, Massimo Carboni, Mario Codognato, Michael Tarantino, Jérôme Sans, Anne Dagbert, Elizabeth Janus, Yilmaz Dziewior, Noemi Smolik, Daniel Birnbaum, and Michael Archer. Cover: Florine Stettheimer. …

Condizione: New. pp. 296 Illus. This item is printed on demand.