Stroud charles e charles e stroud (44 risultati)
Lingua: Inglese
Editore: Pennsylvania Historical Association, University Park, 2012
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Da: Clayton Fine Books, Shepherdstown, WV, U.S.A.Clayton Fine Books
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Aggiungi al carrelloSoft cover. Condizione: Near Fine. First Edition. Near fine in original wrappers.
Lingua: Inglese
Editore: Springer, 2002
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Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
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hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Lingua: Inglese
Editore: Springer, 2002
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Da: Goodwill of Greater Milwaukee and Chicago, Racine, WI, U.S.A.Goodwill of Greater Milwaukee and Chicago
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EUR 46,73
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Condizione: good. Book is considered to be in good or better condition. The actual cover image may not match the stock photo. Hard cover books may show signs of wear on the spine, cover or dust jacket. Paperback book may show signs of wear on spine or cover as well as having a slight bend, curve or creasing to it. Book should ha…ve minimal to no writing inside and no highlighting. Pages should be free of tears or creasing. Stickers should not be present on cover or elsewhere, and any CD or DVD expected with the book is included. Book is not a former library copy.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 49,52
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Condizione: New.
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EUR 48,71
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Condizione: New.
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 73,66
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2002
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Da: WeBuyBooks, Rossendale, LANCS, Regno UnitoWeBuyBooks
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EUR 65,18
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Condizione: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 76,47
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Condizione: New. pp. xxxvi + 856 Illus.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 101,46
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Condizione: New. pp. xxxvi + 856.
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 93,52
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Condizione: New. pp. xxxvi + 856.
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 133,42
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Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer, 2002
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Da: AwesomeBooks, Wallingford, Regno UnitoAwesomeBooks
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 152,23
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hardcover. Condizione: Very Good. A Designerâs Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has cle…arly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 155,20
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Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer -, 2002
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Da: Bahamut Media, Reading, Regno UnitoBahamut Media
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EUR 152,23
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hardcover. Condizione: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Lingua: Inglese
Editore: Springer, 2013
- Brossura
Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 174,21
Spedizione gratuitaSpedito in U.S.A.Quantità: 10 disponibili
Condizione: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2002
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 174,21
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Condizione: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2002
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Da: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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EUR 187,63
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hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.
Lingua: Inglese
Editore: Kluwer Academic, 2002
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Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
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EUR 158,68
EUR 36,65 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9781402070501.
Lingua: Inglese
Editore: Springer, 2013
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 227,25
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Condizione: New. In.
Lingua: Inglese
Editore: Springer, 2002
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 227,25
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Condizione: New. In.
Altre immaginiLingua: Inglese
Editore: Humana, 2013
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 184,95
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Taschenbuch | xx | Englisch | 2013 | Humana | EAN 9781475776263 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2002
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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 257,06
EUR 9,50 spedizioneSpedito da Irlanda a U.S.A.Quantità: 15 disponibili
Condizione: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as…well as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . .
Lingua: Inglese
Editore: Kluwer Academic Publishers, US, 2002
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Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 275,88
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. 2002 ed. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This boo…k is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Lingua: Inglese
Editore: Springer, 2013
- Brossura
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 277,98
EUR 3,45 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. pp. 344.
Lingua: Inglese
Editore: Springer, 2002
- Rilegato
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 279,83
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Condizione: New. pp. 344.
Lingua: Inglese
Editore: Springer US, Humana, 2013
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 223,11
EUR 62,61 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the cu…rrent time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Lingua: Inglese
Editore: Springer US, Springer New York, 2002
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 223,11
EUR 63,41 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current t…ime, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Lingua: Inglese
Editore: Springer, 2013
- Brossura
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 302,61
EUR 11,67 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Paperback. Condizione: Brand New. 340 pages. 9.30x6.20x0.80 inches. In Stock.
Lingua: Inglese
Editore: Springer, 2002
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 305,03
EUR 14,59 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 344 pages. 9.50x6.50x1.00 inches. In Stock.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2002
- Rilegato
Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 323,15
EUR 9,08 spedizioneSpedito in U.S.A.Quantità: 15 disponibili
Condizione: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as…well as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . . Books ship from the US and Ireland.
