ISBN: 9780306441752 - scanning electron microscopy and x-ray microanalysis: a text for biologists, materials scientists and geologists (12 risultati)

- Rilegato
Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 6,90
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardback. Condizione: Good.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
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Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,55
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. 2nd ed. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

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Da: World of Books Inc, Montgomery, IL, U.S.A.World of Books Inc
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Buono
EUR 8,75
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardback. Condizione: Good.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
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Da: -OnTimeBooks-, Phoenix, AZ, U.S.A.-OnTimeBooks-
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 10,13
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

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Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 6,91
EUR 3,37 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
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Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 10,61
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: Bulrushed Books, Moscow, ID, U.S.A.Bulrushed Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Discreto
EUR 9,26
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Condizione: Acceptable. SHIPS FAST. RESCUED + REPAIRED. Features a small coffee mishap, plus a reinforced binding, secured cover, and light annotations or highlighting-a durable, fully readable working copy brought back to life at a great value by our Book Sustainability Project. No access codes or CDs.…

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig, Alton D. Jr.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
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Da: Florida Mountain Book Co., Datil, NM, U.S.A.Florida Mountain Book Co.
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 24,95
EUR 4,94 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Condizione: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.…

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. 2nd Edition
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
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Da: Rob the Book Man, Vancouver, WA, U.S.A.Rob the Book Man
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Quasi ottimo
EUR 59,01
EUR 6,28 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Near Fine. Condizione sovraccoperta: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: DeckleEdge LLC, Albuquerque, NM, U.S.A.DeckleEdge LLC
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 65,55
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: new.

Scanning Electron Microscopy and X-ray Microanalysis
Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, D.C. Joy
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Da: Buchpark, Trebbin, GermaniaBuchpark
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Ottimo
EUR 19,10
EUR 105,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibile
Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 800 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: Solr Books, Lincolnwood, IL, U.S.A.Solr Books
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 925,69
EUR 7,17 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Condizione: very_good. This book is in Very good condition. There may be a few flaws like shelf wear and some light wear.