EUR 47,70
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Aggiungi al carrelloCondizione: New. pp. 240.
EUR 46,35
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Aggiungi al carrelloCondizione: New. pp. 240 Illus.
EUR 48,74
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Aggiungi al carrelloCondizione: New. pp. 240.
Da: Better World Books, Mishawaka, IN, U.S.A.
Prima edizione
EUR 70,17
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Aggiungi al carrelloCondizione: Very Good. 1st Edition. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.
EUR 101,04
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EUR 95,52
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Aggiungi al carrelloCondizione: New. SUPER FAST SHIPPING.
EUR 95,52
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Aggiungi al carrelloCondizione: New. SUPER FAST SHIPPING.
EUR 101,30
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EUR 101,63
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EUR 106,92
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Aggiungi al carrelloCondizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
EUR 111,03
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EUR 111,03
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EUR 110,48
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Da: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, Germania
EUR 106,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students. 240 pp. Englisch.
EUR 134,32
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Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
EUR 141,71
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Aggiungi al carrelloCondizione: New. pp. 240.
EUR 92,96
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Aggiungi al carrelloKartoniert / Broschiert. Condizione: New. This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electro.
Editore: Springer US, Springer New York Apr 2013, 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 106,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 240 pp. Englisch.
Editore: Springer US, Springer New York Apr 2013, 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 109,94
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
Condizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher.
EUR 114,36
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Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
EUR 166,32
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Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
EUR 219,38
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 209,96
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Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
EUR 242,52
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 106,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis. 240 pp. Englisch.
Da: moluna, Greven, Germania
EUR 92,27
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Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electro.
Editore: Springer-Verlag New York Inc., 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 135,26
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Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 370.
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 135,26
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Aggiungi al carrelloHardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 544.
Da: Majestic Books, Hounslow, Regno Unito
EUR 148,37
Convertire valutaQuantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 240 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.