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Editore: Cultural and Historical Data Publishing (collection of books
Da: liu xing, Nanjing, JS, Cina
EUR 39,10
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Aggiungi al carrelloSoft cover. Condizione: New. Language:Chinese.Author:CONG CHENG DOU SHANG YE YIN HANG KAN JIE FANG QIAN JIN RONG YE JI XING.Binding:.Publisher:Cultural and Historical Data Publishing (collection of books.
Condizione: Used. pp. 240.
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Aggiungi al carrelloCondizione: Used. pp. 240 Illus.
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Condizione: New. pp. 240.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2000
ISBN 10: 079237861X ISBN 13: 9780792378617
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
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Aggiungi al carrelloCondizione: New. Addresses electrothermal problems in modern VLSI systems. This book discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Num Pages: 233 pages, 36 black & white illustrations, biography. BIC Classification: TJF; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 14. Weight in Grams: 514. . 2000. Hardback. . . . .
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Aggiungi al carrelloCondizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Electrothermal Analysis of VLSI Systems | Yi-Kan Cheng (u. a.) | Taschenbuch | xxiii | Englisch | 2013 | Humana | EAN 9781475773736 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2000
ISBN 10: 079237861X ISBN 13: 9780792378617
Da: Kennys Bookstore, Olney, MD, U.S.A.
Condizione: New. Addresses electrothermal problems in modern VLSI systems. This book discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Num Pages: 233 pages, 36 black & white illustrations, biography. BIC Classification: TJF; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 14. Weight in Grams: 514. . 2000. Hardback. . . . . Books ship from the US and Ireland.
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
Lingua: Inglese
Editore: Springer US, Springer New York, 2000
ISBN 10: 079237861X ISBN 13: 9780792378617
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 114,36
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
Da: liu xing, Nanjing, JS, Cina
EUR 35,28
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Aggiungi al carrellopaperback. Condizione: New. Language:Chinese.Paperback. Publisher: People s Transportation.
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Aggiungi al carrellopaperback. Condizione: Good. The TCM Archive granted 1994.1.
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Da: liu xing, Nanjing, JS, Cina
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Aggiungi al carrellopaperback. Condizione: Good. Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.The Masayoshi Ohira pass a version of a printed 621Four Satisfaction guaranteed,or money back.
Da: liu xing, Nanjing, JS, Cina
EUR 39,24
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Aggiungi al carrellopaperback. Condizione: Good. Collation of (for the Journal for college students).
Lingua: Cinese
Editore: Hunan literature and Art Publishing House, 2011
ISBN 10: 7540449853 ISBN 13: 9787540449858
Da: liu xing, Nanjing, JS, Cina
EUR 52,31
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Aggiungi al carrellopaperback. Condizione: New. Language:Chinese.Pages Number: 387 Publisher: Hunan Arts Pub. Date :2011-7-1. The book tells the story with 51 small and difficult to overcome the crisis. the final victory. Tough times do not last long. and strong people are able to always strong. Many others to follow suit money. job loss. or even reduced household expenditure. Many people face life's challenges. or encounter natural disasters such as hurricanes and fire struck. Many people in the swing of life at the end. they all face the.
Lingua: Cinese
Editore: Southwest Jiaotong University Press, 2018
ISBN 10: 7564362294 ISBN 13: 9787564362294
Da: liu xing, Nanjing, JS, Cina
EUR 57,47
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Aggiungi al carrellopaperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2018-05-01 Publisher: Southwest Jiaotong University Press. to meet the needs of rural road construction and development of Dayi. improve construction quality and service levels Dayi rural roads. according to control the West background of the new requirements. the preparation group Dayi combined with the actual preparation of the on West control technical Guidelines for rural road construction Dayi County development strategy (trial). to promote Dayi coun.