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EUR 46,71
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Aggiungi al carrelloCondizione: New. pp. 240 Illus.
EUR 48,74
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Aggiungi al carrelloCondizione: New. pp. 240.
Da: Better World Books, Mishawaka, IN, U.S.A.
Prima edizione
EUR 70,72
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Aggiungi al carrelloCondizione: Very Good. 1st Edition. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.
EUR 79,25
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Aggiungi al carrelloCondizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher.
EUR 92,96
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Aggiungi al carrelloKartoniert / Broschiert. Condizione: New. This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electro.
EUR 110,13
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Aggiungi al carrelloCondizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
EUR 101,83
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EUR 101,83
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EUR 119,81
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Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
Da: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, Germania
EUR 106,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students. 240 pp. Englisch.
EUR 111,65
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EUR 111,65
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Aggiungi al carrelloCondizione: New. In.
EUR 96,26
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Aggiungi al carrelloCondizione: New. SUPER FAST SHIPPING.
EUR 96,26
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EUR 116,11
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Editore: Springer US, Springer New York Apr 2013, 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 106,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 240 pp. Englisch.
Editore: Springer US, Springer New York Apr 2013, 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 109,94
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
EUR 111,63
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Aggiungi al carrelloCondizione: New.
EUR 114,36
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Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
Editore: Springer-Verlag New York Inc., 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 128,02
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Aggiungi al carrelloCondizione: New. Num Pages: 233 pages, 36 black & white illustrations. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 373. . 2013. Softcover reprint of the original 1st ed. 2000. Paperback. . . . .
EUR 120,90
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 121,13
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 127,61
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 142,82
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Aggiungi al carrelloCondizione: New. pp. 240.
Editore: Kluwer Academic Publishers, 2000
ISBN 10: 079237861X ISBN 13: 9780792378617
Lingua: Inglese
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 149,51
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Aggiungi al carrelloCondizione: New. Addresses electrothermal problems in modern VLSI systems. This book discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Num Pages: 233 pages, 36 black & white illustrations, biography. BIC Classification: TJF; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 14. Weight in Grams: 514. . 2000. Hardback. . . . .
Editore: Springer-Verlag New York Inc., 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: Kennys Bookstore, Olney, MD, U.S.A.
EUR 159,85
Convertire valutaQuantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Num Pages: 233 pages, 36 black & white illustrations. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 373. . 2013. Softcover reprint of the original 1st ed. 2000. Paperback. . . . . Books ship from the US and Ireland.
EUR 102,09
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EUR 102,42
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Aggiungi al carrelloCondizione: New.
Editore: Springer-Verlag New York Inc., New York, NY, 2013
ISBN 10: 1475773730 ISBN 13: 9781475773736
Lingua: Inglese
Da: Grand Eagle Retail, Mason, OH, U.S.A.
EUR 105,58
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students. Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.