Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 103,44
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 109,98
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Condizione: New.
hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 168,17
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642024165 ISBN 13: 9783642024160
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 106,99
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the last 7 years, the rst edition of 'Lock-in Thermography' has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques are different kinds of Illuminated Lock-In Thermography (ILIT) and Carrier Density Imaging, resp. Infrared Lifetime Imaging (CDI/ILM). While ILIT is performed on solar cells, CDI/ILM is performed on bare wafers for imaging the local minority carrier lifetime and the local concentration of trapping centers. The new edition of this book implements these new developments. One new section entitled 'Timing strategies' is added. In this, new ways are introduced to overcome previous limitations of the choice of the lock-in frequency in comparison with the frame rate of the camera. The previous diffraction limit of the spatial resolution can be overcome by a factor of up to 4 by applying so-called solid immersion lenses. This technique is introduced and its application for failure analysis of ICs, where highest possible spatial resolution is desired, is shown in another new section.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 162,67
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 153,06
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642024165 ISBN 13: 9783642024160
Lingua: Inglese
Da: Buchpark, Trebbin, Germania
EUR 83,88
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New.
Editore: Springer International Publishing, 2019
ISBN 10: 3319998242 ISBN 13: 9783319998244
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 171,19
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Da: Revaluation Books, Exeter, Regno Unito
EUR 249,56
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 3rd edition. 344 pages. 9.25x6.10x1.18 inches. In Stock.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 234,86
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. New. book.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 364,55
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
Da: preigu, Osnabrück, Germania
EUR 99,50
Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Lock-in Thermography | Basics and Use for Evaluating Electronic Devices and Materials | Otwin Breitenstein (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 2010 | Springer-Verlag GmbH | EAN 9783642024160 | Verantwortliche Person für die EU: Lauinger, Sonia, Sonia Lauinger, Lauinger Verlag, Heinrich-Köhler-Platz 8, 76187 Karlsruhe, mail[at]lauinger-verlag[dot]de | Anbieter: preigu Print on Demand.
Editore: Springer International Publishing, 2019
ISBN 10: 3319998242 ISBN 13: 9783319998244
Lingua: Inglese
Da: preigu, Osnabrück, Germania
EUR 150,15
Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Lock-in Thermography | Basics and Use for Evaluating Electronic Devices and Materials | Otwin Breitenstein (u. a.) | Buch | xxi | Englisch | 2019 | Springer International Publishing | EAN 9783319998244 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Da: Majestic Books, Hounslow, Regno Unito
EUR 233,82
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 237,23
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.