Lingua: Inglese
Editore: Plenum Press, New York, 1966
Da: BookHome, San Jose, CA, U.S.A.
Hardcover. Condizione: Very Good. Condizione sovraccoperta: Good. Condition: Book: slight shelf wear dust jacket: minor edgewear "Olesen's work on radiation effects on electronic systems is a comprehensive resource for understanding the impact of radiation on electronic devices. It is a valuable addition to the field of radiation effects and electronic systems, providing insights into the mechanisms and implications of radiation exposure on electronic components. ".
Condizione: New.
Editore: Plenum Press, 1966
Da: BookDepart, Shepherdstown, WV, U.S.A.
Hardcover. Condizione: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number taped to spine; fading, light soiling, and shelf wear to exterior; corners bumped; fading to pages, with spotting to page edges; otherwise in good condition with clean text, firm binding.
Condizione: As New. Unread book in perfect condition.
EUR 61,35
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
EUR 57,50
Quantità: 10 disponibili
Aggiungi al carrelloPF. Condizione: New.
Condizione: New. pp. 252.
EUR 79,08
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 249 pages. 9.10x6.00x0.30 inches. In Stock.
Condizione: Very Good. 587 pp., Hardcover, a bookplate to the front free endpaper else very good in a very good dust jacket. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
Lingua: Inglese
Editore: Springer US, Springer New York, 2014
ISBN 10: 1489957073 ISBN 13: 9781489957078
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 58,39
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering.
EUR 131,32
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
EUR 141,75
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
EUR 141,74
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 154,59
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 144,94
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 177,09
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 182,89
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Aggiungi al carrelloPaperback. Condizione: New. Softcover reprint of the original 1st ed. 1986.
Lingua: Inglese
Editore: VAN NOSTRAND REINHOLD CO, NY, 1986
ISBN 10: 0442254172 ISBN 13: 9780442254179
Da: Princeton Antiques Bookshop / Ruffolo Enterprises, Atlantic City, NJ, U.S.A.
HARD BACK BLUE. DLV written in green marker to all page foredges DATE PUBLISHED: 1986 EDITION: 587 VERY GOOD. JACKET: VERY GOOD DJ.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 178,74
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 200,12
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Majestic Books, Hounslow, Regno Unito
EUR 194,68
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 400.
EUR 148,87
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Eishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd.Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/.
Condizione: New. pp. 608.
Lingua: Inglese
Editore: World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Da: BennettBooksLtd, Los Angeles, CA, U.S.A.
hardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
Da: Revaluation Books, Exeter, Regno Unito
EUR 204,70
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.
Lingua: Inglese
Editore: John Wiley & Sons Inc, New York, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
Da: CitiRetail, Stevenage, Regno Unito
Prima edizione
EUR 178,75
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Lingua: Inglese
Editore: Springer Netherlands, Springer Netherlands, 2014
ISBN 10: 9401753571 ISBN 13: 9789401753579
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 157,86
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering.
Hardcover. Condizione: new. New Copy. Customer Service Guaranteed.
EUR 227,88
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 608 pages. 9.02x5.98x1.37 inches. In Stock.
EUR 172,65
Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Softcover reprint of the original 1st ed. 1986.