Fultz brent howe james (26 risultati)

Hardcover. Condizione: Wie neu. 778 S., Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1355 3rd corrected Ed. 2008, corr. 2nd printing 2009.

Hardcover. Condizione: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

hardcover. Condizione: Befriedigend. 767 Seiten; 9783540678410.4 Gewicht in Gramm: 2.

hardcover. Condizione: Befriedigend. 778 Seiten; 9783540738855.4 Gewicht in Gramm: 2.

hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Condizione: Good. No Dust Jacket. Second Edition. Second edition. An ex-library copy in original pictorial hard covers of this 748-page volume. The usual ex-libris markings. The binding is sound, the text is clean/unmarked, and there is little cover wear. No dust jacket, apparently as issued. Book.…

Condizione: New.

Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

Condizione: New.

Condizione: New.

Condizione: New. In English.

Hardcover. Condizione: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.…

Hardcover. Condizione: New. 3rd Edition. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.

Condizione: New.

Condizione: New.

Condizione: New. In English.

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: As New. Unread book in perfect condition.

Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: As New. Unread book in perfect condition.

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: very_good. This book is in Very good condition. There may be a few flaws like shelf wear and some light wear.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .…

Condizione: New. Print on Demand.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .…

Condizione: New. PRINT ON DEMAND.