Lingua: Inglese
Editore: Intl Thomson Business Pr (edition ), 1993
ISBN 10: 0415059445 ISBN 13: 9780415059442
Da: BooksRun, Philadelphia, PA, U.S.A.
Misc. Supplies. Condizione: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Lingua: Inglese
Editore: Stockholm International Peace Research Instit, 1996
ISBN 10: 0198291965 ISBN 13: 9780198291961
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Paperback. Condizione: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 17,00
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Aggiungi al carrelloCondizione: New.
Da: BargainBookStores, Grand Rapids, MI, U.S.A.
Paperback or Softback. Condizione: New. Combat Identification Modeling Using Robust Optimization Techniques. Book.
Da: Revaluation Books, Exeter, Regno Unito
EUR 16,97
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 1st edition. 176 pages. 8.75x5.50x0.75 inches. In Stock.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 19,46
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 18,47
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Aggiungi al carrelloCondizione: New.
EUR 25,38
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Aggiungi al carrelloTaschenbuch. Condizione: Gut. 384 Seiten ex Library Book aus einer wissenschaftlichen Bibliothek Sprache: Englisch Gewicht in Gramm: 469.
EUR 24,38
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Aggiungi al carrelloCondizione: New. KlappentextrnrnThe purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 25,55
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware - The purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices in ROC theory were adapted to act as controllable factors. In this research a simple virtual battlespace representation is employed. The experimental results of the CID system are summarized by a posterior confusion matrix and throughout the confusion matrix analysis we can obtain all various types of data such as accuracy, error cost, error rates, and so forth. To find the optimal parameters three evaluation techniques were applied: (1) Linearly constrained discrete optimization, (2) Taguchi's S|N ratio method and (3) Robust parameter design with a combined array. The results are compared and contrasted across different objective functions.
Lingua: Inglese
Editore: British Library, Historical Print Editions, 2012
ISBN 10: 1288327676 ISBN 13: 9781288327676
Da: PBShop.store US, Wood Dale, IL, U.S.A.
EUR 20,59
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Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 18,48
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Aggiungi al carrelloPAP. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
EUR 105,94
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
EUR 120,91
Quantità: 4 disponibili
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 110,75
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
hardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 101,23
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
Condizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 118,70
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 131,70
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 123,18
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EUR 148,30
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Aggiungi al carrelloCondizione: New. Brand new! Please provide a physical shipping address.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 164,17
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Aggiungi al carrelloCondizione: New. In.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 164,17
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EUR 181,04
Quantità: 3 disponibili
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EUR 136,16
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Aggiungi al carrelloGebunden. Condizione: New.
Condizione: New.
Condizione: New. pp. 424.
Da: Buchpark, Trebbin, Germania
EUR 92,24
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: ¿ the economic impact of employing the microelectronics fabricated by in dustry, ¿ a study of the relationship between reliability and yield, ¿ the progression toward miniaturization and higher reliability, and ¿ the correctness and complexity of new system designs, which include a very significant portion of software.