Joseph eric dale (42 risultati)

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph,Joy, David C.,Newbury, Dale E.,Lifshin, Eric,Echlin, Patrick,Fiori, Charles
- Rilegato
Da: HPB Inc., Dallas, TX, U.S.A.HPB Inc.
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 4,60
EUR 3,35 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Discreto
EUR 8,17
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Fair. No Jacket. Former library book; Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.ThriftBooks-Dallas
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 8,17
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,17
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.ThriftBooks-Dallas
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 8,17
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,17
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein~Dale E. Newbury~Patrick Echlin~David C. Joy~Charles Fiori~Eric Lifshin
- Rilegato
Da: Bookmans, tucson, AZ, U.S.A.Bookmans
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Discreto
EUR 4,60
EUR 3,56 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Acceptable. Highlighting/Underlining/Notes etc. Satisfaction 100% guaranteed.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,83
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. 2nd ed. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

- Rilegato
Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 7,22
EUR 3,35 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
- Rilegato
Da: Half Price Books Inc., Dallas, TX, U.S.A.Half Price Books Inc.
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 7,35
EUR 3,35 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
- Rilegato
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 10,89
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
- Rilegato
Da: Visible Voice Books, Cleveland, OH, U.S.A.Visible Voice Books
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 6,90
EUR 4,02 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. Springer November 1981.

Lingua: Inglese
Editore: Hargrove Press, 2025
- Brossura
Da: 2nd Life Books, Burlington, NJ, U.S.A.2nd Life Books
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,57
EUR 3,57 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Condizione: very_good. Used book in very good condition. May have some minor wear. May NOT include discs, or access code or other supplemental material. Ships directly from Amazon and is eligible for Prime or super saver FREE shipping. We ship Monday-Saturday and respond to inquiries within 24 hours.…

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: SoCo Books, Trinidad, CO, U.S.A.SoCo Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 7,82
EUR 6,24 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. Condizione sovraccoperta: Fair. 2nd Edition.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig, Alton D. Jr.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: Florida Mountain Book Co., Datil, NM, U.S.A.Florida Mountain Book Co.
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 24,78
EUR 4,91 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Condizione: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.…

- Rilegato
- Prima edizione
Da: Paradou Books, Richmond, VA, U.S.A.Paradou Books
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 27,59
EUR 3,53 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Very Good. 1st Edition. Clothbound hardcover, 119 pgs. Essays, color illus. Very light rubbing to cover, else fine.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Rilegato
Da: A Squared Books (Don Dewhirst), South Lyon, MI, U.S.A.A Squared Books (Don Dewhirst)
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 41,38
EUR 5,79 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. 3rd. Third Edition; 2003. Glossy paper covers; minimal wear; stain on top edge, otherwise like new condition; 4to - over 9 3/4" to 12" tall; no jacket. Interior is bright, clean and unmarked; 690 pages. Additional shipping charges may be required due to the size and weight of book.…

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Rilegato
Da: -OnTimeBooks-, Phoenix, AZ, U.S.A.-OnTimeBooks-
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 49,76
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

- Rilegato
Da: Books From California, Simi Valley, CA, U.S.A.Books From California
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 47,27
EUR 4,45 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. Cover and edges may have some wear.

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Lyman, Charles E.; Newbury, Dale E.; Goldstein, Joseph; Williams, David B.; Romig Jr., Alton D.; Armstrong, John; Echlin, Patrick; Fiori, Charles; Joy, David C.; Lifshin, Eric; Peters, Klaus-Rüdiger
- Brossura
Da: -OnTimeBooks-, Phoenix, AZ, U.S.A.-OnTimeBooks-
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 52,30
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

- Brossura
Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 49,59
EUR 3,35 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. 2nd Edition
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
- Rilegato
Da: Rob the Book Man, Vancouver, WA, U.S.A.Rob the Book Man
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Quasi ottimo
EUR 58,62
EUR 6,24 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Hardcover. Condizione: Near Fine. Condizione sovraccoperta: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: DeckleEdge LLC, Albuquerque, NM, U.S.A.DeckleEdge LLC
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 65,11
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: new.

Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick and Joy, D. C.
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Rilegato
Da: online-buch-de, Dozwil, Svizzeraonline-buch-de
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 64,00
EUR 36,00 spedizioneSpedito da Svizzera a U.S.A.Quantità: 1 disponibile
Jun 01, 1992. Condizione: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Rilegato
Da: DeckleEdge LLC, Albuquerque, NM, U.S.A.DeckleEdge LLC
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 120,46
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: new.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 102,58
EUR 17,68 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In English.
Altre immagini- Brossura
Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 128,62
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Paperback. Condizione: New. Third Edition 2003. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.…

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Brossura
Da: California Books, Miami, FL, U.S.A.California Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 140,69
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Lyman, Charles E.; Newbury, Dale E.; Goldstein, Joseph; Williams, David B.; Romig Jr., Alton D.; Armstrong, John; Echlin, Patrick; Fiori, Charles; Joy, David C.; Lifshin, Eric; Peters, Klaus-Rüdiger
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 130,09
EUR 13,36 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In English.

- Brossura
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 92,27
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New.